Energy level alignment of C60/Co using x-ray and UV photoelectron spectroscopy

2006 ◽  
Vol 18 (33) ◽  
pp. S2055-S2060 ◽  
Author(s):  
J H Seo ◽  
S J Kang ◽  
C Y Kim ◽  
K-H Yoo ◽  
C N Whang
Keyword(s):  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Energy Level Alignment ◽  
Uv Photoelectron Spectroscopy

Energy level alignment at C 60 /Hf using x-ray and ultraviolet photoelectron spectroscopy

2006 ◽  
Author(s):  
C. Y. Kim ◽  
J. H. Seo ◽  
S. W. Cho ◽  
K. -H. Yoo ◽  
C. N. Whang ◽  
...  
Keyword(s):  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
X Ray ◽  
Energy Level Alignment

scholarly journals Influence of Graphite Layer on Electronic Properties of MgO/6H-SiC(0001) Interface

Materials ◽  
2021 ◽  
Vol 14 (15) ◽  
pp. 4189
Author(s):  
R. Lewandków ◽  
P. Mazur ◽  
A. Trembułowicz ◽  
A. Sabik ◽  
R. Wasielewski ◽  
...  
Keyword(s):  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
Valence Band Maximum ◽  
Graphite Layer ◽  
Band Maximum ◽  
X Ray ◽  
Mgo Layers ◽  
Uv Photoelectron Spectroscopy ◽  
Potential Use

This paper concerns research on magnesium oxide layers in terms of their potential use as a gate material for SiC MOSFET structures. The two basic systems of MgO/SiC(0001) and MgO/graphite/SiC(0001) were deeply investigated in situ under ultrahigh vacuum (UHV). In both cases, the MgO layers were obtained by a reactive evaporation method. Graphite layers terminating the SiC(0001) surface were formed by thermal annealing in UHV. The physicochemical properties of the deposited MgO layers and the systems formed with their participation were determined using X-ray and UV photoelectron spectroscopy (XPS, UPS). The results confirmed the formation of MgO compounds. Energy level diagrams were constructed for both systems. The valence band maximum of MgO layers was embedded deeper on the graphitized surface than on the SiC(0001).

Revealing unique energy level alignment at graphene/MoS2 2-dimensional layered junction using in situ ambient pressure x-ray photoelectron spectroscopy

2D Materials ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 045012
Author(s):  
Dong-Jin Yun ◽  
Ane Etxebarria ◽  
Kyung-Jae Lee ◽  
Minsu Seol ◽  
Hae-ryong Kim ◽  
...  
Keyword(s):  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
X Ray ◽  
Energy Level Alignment

Carbon monoxide oxidation by nitric oxide on iridium (111) studied by x-ray and uv-photoelectron spectroscopy

1977 ◽  
Vol 1 (1) ◽  
pp. 25-32 ◽  
Author(s):  
P.A. Zhdan ◽  
G.K. Boreskov ◽  
A.I. Boronin ◽  
A.P. Schepelin ◽  
W.F. Egelhoff ◽  
...  
Keyword(s):  
Nitric Oxide ◽  
Carbon Monoxide ◽  
Photoelectron Spectroscopy ◽  
Carbon Monoxide Oxidation ◽  
X Ray ◽  
Uv Photoelectron Spectroscopy

Energy level alignment between C60 and Al using ultraviolet photoelectron spectroscopy

2006 ◽  
Vol 252 (22) ◽  
pp. 8015-8017 ◽  
Author(s):  
J.H. Seo ◽  
S.J. Kang ◽  
C.Y. Kim ◽  
S.W. Cho ◽  
K.-H. Yoo ◽  
...  
Keyword(s):  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
Ultraviolet Photoelectron Spectroscopy ◽  
Energy Level Alignment

Energy level alignment in TiO2/metal sulfide/polymer interfaces for solar cell applications

2014 ◽  
Vol 16 (32) ◽  
pp. 17099-17107 ◽  
Author(s):  
Rebecka Lindblad ◽  
Ute B. Cappel ◽  
Flannan T. F. O'Mahony ◽  
Hans Siegbahn ◽  
Erik M. J. Johansson ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Energy Level ◽  
Photoelectron Spectroscopy ◽  
Metal Sulfide ◽  
Polymer Interfaces ◽  
Experimental Energy ◽  
Experimental Energy Level ◽  
Energy Level Alignment

The experimental energy level alignment has been determined for complete TiO2/metal sulfide/polymer interfaces using photoelectron spectroscopy and the results are compared to the function of solar cells.

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