Ellipsometric and Raman spectroscopic study of nanocrystalline silicon thin films prepared by a rf magnetron sputtering technique
2008 ◽
Vol 20
(44)
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pp. 445221
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Keyword(s):
2011 ◽
Vol 23
(7)
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pp. 1300-1305
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2001 ◽
Vol 82-84
◽
pp. 637-644
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2009 ◽
Vol 2
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pp. 012039
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