Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser

2011 ◽  
Vol 40 (11) ◽  
pp. 1657-1661
Author(s):  
段国平 DUAN Guoping ◽  
陈俊领 CHEN Junling ◽  
韩俊鹤 HAN Junhe ◽  
黄明举 HUANG Mingju
2008 ◽  
Vol 47 (4) ◽  
pp. 3046-3049 ◽  
Author(s):  
Shuntaro Fujii ◽  
Shin-Ichiro Kuroki ◽  
Xiaoli Zhu ◽  
Masayuki Numata ◽  
Koji Kotani ◽  
...  

2019 ◽  
Vol 2 (10) ◽  
pp. 71-75
Author(s):  
Shin-Ichiro Kuroki ◽  
Shuntaro Fujii ◽  
Koji Kotani ◽  
Takashi Ito

2018 ◽  
Vol 57 (3) ◽  
pp. 031302 ◽  
Author(s):  
Thi Thuy Nguyen ◽  
Mitsuhisa Hiraiwa ◽  
Tomoyuki Koganezawa ◽  
Satoshi Yasuno ◽  
Shin-Ichiro Kuroki

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