Raman Spectroscopic Study of the Crystallization of Intrinsic Amorphous Silicon Thin Films with a 488 nm Continuouswave Laser
2008 ◽
Vol 47
(4)
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pp. 3046-3049
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Keyword(s):
2009 ◽
Vol 48
(4)
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pp. 04C129
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Keyword(s):
2011 ◽
Vol 23
(7)
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pp. 1300-1305
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2018 ◽
Vol 57
(3)
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pp. 031302
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Keyword(s):
2008 ◽
Vol 20
(44)
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pp. 445221
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