Abnormal hysteresis formation in hump region after positive gate bias stress in low-temperature poly-silicon thin film transistors
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2017 ◽
Vol 32
(2)
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pp. 91-96
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2011 ◽
Vol 58
(10)
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pp. 3422-3427
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2007 ◽
Vol 28
(7)
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pp. 599-602
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