AbstractWe have studied nematic hybrid films with homeotropic alignment at the top surface and various controlled degrees of in plane ordering, going from a random degenerate organization to a completely uniform alignment along one direction, at the bottom one. We show, by Monte Carlo (MC) computer simulations and experiments on photopatterned films with the bottom support surface fabricated with in-plane order similar to the simulated ones, that the point defects observed in the case of random planar orientations at the bottom tend to arrange along a filament as the surface ordering is sufficiently increased. MC simulations complement the polarized microscopy texture observations allowing to inspect the 3D structure of the defects and examine the role of elastic constants.
Role of Point Defects and Defect Complexes in Silicon Device Processing: Summary Report and Papers of the Second Workshop, 24-26 August 1992, Breckenridge, Colorado