Dimensional and mechanical characterization of metallic thin films based on the measurement of surface acoustic waves dispersion with Slant Stack transform

2020 ◽  
Vol 31 (10) ◽  
pp. 105009
Author(s):  
Tahar Kadi ◽  
Marc Duquennoy ◽  
Dame Fall ◽  
Nikolay Smagin ◽  
Bogdan Piwakowski ◽  
...  
Keyword(s):  
Thin Films ◽  
Acoustic Waves ◽  
Mechanical Characterization ◽  
Surface Acoustic Waves ◽  
Metallic Thin Films

Mechanical Characterization of Nanostructured Thin Films Used to Imporve Mechatronic Components

2017 ◽  
Vol 15 (12) ◽  
pp. 48-54
Author(s):  
Liliana-Laura Badita ◽  
Gheorghe Gheorghe ◽  
Vasile Bratu ◽  
Valentin Gornoava ◽  
Marian Vocurek ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Steel Substrate ◽  
Metallic Thin Films ◽  
Substrate Type ◽  
Different Types ◽  
The Common ◽  
Scratch Tests ◽  
Steel Substrates

Abstract Taking into account the importance of mechatronic applications, researches regarding the possibility to improve the lifetime of mechatronic components were made. Nanostructured metallic thin films (Ti, Cr, Al and Ti/Al multilayer) were deposited on different types of steel substrates, because nanomaterials have exceptional properties in relation to the common materials. In this paper a part of the results obtained after mechanical and topographic characterization of the thin films are presented. Cr is the deposited thin film showing the highest hardness on the surface of steel substrate type OSC. After the scratch tests realized, Ti layer presented the best adhesion on all types of steel substrates used in experiments. The results of these researches could be extremely useful for engineers in the mechatronic field.

Mechanical characterization of metallic thin films by bulge and scratch testing

2016 ◽  
Vol 289 ◽  
pp. 69-74 ◽  
Author(s):  
Hassan Javed ◽  
Benoit Merle ◽  
Eva Preiß ◽  
Romain Hivet ◽  
Alessandro Benedetto ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Metallic Thin Films ◽  
Scratch Testing

Accurate characterization of SiO2 thin films using surface acoustic waves

2015 ◽  
Vol 62 (4) ◽  
pp. 736-743 ◽  
Author(s):  
Matthias Knapp ◽  
Alexey M. Lomonosov ◽  
Paul Warkentin ◽  
Philipp M. Jager ◽  
Werner Ruile ◽  
...  
Keyword(s):  
Thin Films ◽  
Acoustic Waves ◽  
Surface Acoustic Waves

Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films

2015 ◽  
Vol 48 (41) ◽  
pp. 415303 ◽  
Author(s):  
A Wyss ◽  
M Schamel ◽  
A S Sologubenko ◽  
R Denk ◽  
M Hohage ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Metallic Thin Films ◽  
Reflectance Anisotropy

Characterization of RF Sputtered ZnO Piezoelectric Films Using Transmission Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 86-87
Author(s):  
Kemining W. Yeh ◽  
Richard S. Muller ◽  
Wei-Kuo Wu ◽  
Jack Washburn
Keyword(s):  
Integrated Circuit ◽  
Acoustic Waves ◽  
New Technology ◽  
Surface Acoustic Waves ◽  
Electromechanical Properties ◽  
Leading Role ◽  
Saw Devices ◽  
Transmission Electron ◽  
High Degree

Considerable and continuing interest has been shown in the thin film transducer fabrication for surface acoustic waves (SAW) in the past few years. Due to the high degree of miniaturization, compatibility with silicon integrated circuit technology, simplicity and ease of design, this new technology has played an important role in the design of new devices for communications and signal processing. Among the commonly used piezoelectric thin films, ZnO generally yields superior electromechanical properties and is expected to play a leading role in the development of SAW devices.

scholarly journals Double flow reversal in thin liquid films driven by megahertz-order surface vibration

2014 ◽  
Vol 470 (2169) ◽  
pp. 20130765 ◽  
Author(s):  
Amgad R. Rezk ◽  
Ofer Manor ◽  
Leslie Y. Yeo ◽  
James R. Friend
Keyword(s):  
Thin Films ◽  
Acoustic Waves ◽  
Surface Acoustic Waves ◽  
Intermolecular Forces ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Propagation Direction ◽  
Flow Reversal ◽  
Order Surface ◽  
Over Time

Arising from an interplay between capillary, acoustic and intermolecular forces, surface acoustic waves (SAWs) are observed to drive a unique and curious double flow reversal in the spreading of thin films. With a thickness at or less than the submicrometre viscous penetration depth, the film is seen to advance along the SAW propagation direction, and self-similarly over time t 1/4 in the inertial limit. At intermediate film thicknesses, beyond one-fourth the sound wavelength λ ℓ in the liquid, the spreading direction reverses, and the film propagates against the direction of the SAW propagation. The film reverses yet again, once its depth is further increased beyond one SAW wavelength. An unstable thickness region, between λ ℓ /8 and λ ℓ /4, exists from which regions of the film either rapidly grow in thickness to exceed λ ℓ /4 and move against the SAW propagation, consistent with the intermediate thickness films, whereas other regions decrease in thickness below λ ℓ /8 to conserve mass and move along the SAW propagation direction, consistent with the thin submicrometre films.

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