Mechanical Characterization of Nanostructured Thin Films Used to Imporve Mechatronic Components

2017 ◽  
Vol 15 (12) ◽  
pp. 48-54
Author(s):  
Liliana-Laura Badita ◽  
Gheorghe Gheorghe ◽  
Vasile Bratu ◽  
Valentin Gornoava ◽  
Marian Vocurek ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Steel Substrate ◽  
Metallic Thin Films ◽  
Substrate Type ◽  
Different Types ◽  
The Common ◽  
Scratch Tests ◽  
Steel Substrates

Abstract Taking into account the importance of mechatronic applications, researches regarding the possibility to improve the lifetime of mechatronic components were made. Nanostructured metallic thin films (Ti, Cr, Al and Ti/Al multilayer) were deposited on different types of steel substrates, because nanomaterials have exceptional properties in relation to the common materials. In this paper a part of the results obtained after mechanical and topographic characterization of the thin films are presented. Cr is the deposited thin film showing the highest hardness on the surface of steel substrate type OSC. After the scratch tests realized, Ti layer presented the best adhesion on all types of steel substrates used in experiments. The results of these researches could be extremely useful for engineers in the mechatronic field.

Mechanical characterization of metallic thin films by bulge and scratch testing

2016 ◽  
Vol 289 ◽  
pp. 69-74 ◽  
Author(s):  
Hassan Javed ◽  
Benoit Merle ◽  
Eva Preiß ◽  
Romain Hivet ◽  
Alessandro Benedetto ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Metallic Thin Films ◽  
Scratch Testing

Reflectance anisotropy spectroscopy as a tool for mechanical characterization of metallic thin films

2015 ◽  
Vol 48 (41) ◽  
pp. 415303 ◽  
Author(s):  
A Wyss ◽  
M Schamel ◽  
A S Sologubenko ◽  
R Denk ◽  
M Hohage ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Metallic Thin Films ◽  
Reflectance Anisotropy

In-Situ Nanoindentation Hardness Apparatus for Mechanical Characterization of Extremely Thin Films

1988 ◽  
Vol 110 (3) ◽  
pp. 563-571 ◽  
Author(s):  
B. Bhushan ◽  
V. S. Williams ◽  
R. V. Shack
Keyword(s):  
Thin Films ◽  
Personal Computer ◽  
Mechanical Characterization ◽  
Linear Actuator ◽  
Air Bearing ◽  
Polarization Interferometer ◽  
Nanoindentation Hardness ◽  
Scratch Tests

A nanoindenter apparatus is developed to measure the microhardness and microviscoelastic properties (in compression) of extremely thin films. In-situ indentation measurements are made by polarization interferometer by monitoring the absolute motions of the sample and indenter. A linear actuator provides the load, and the indenter load is inferred from the position of the indenter measured by the interferometer and the stiffness of the indenter parallel spring guide. A personal computer and associated electronics provide the control for load and penetration. These allow the instrument to determine microhardness and characterize microviscoelastic creep and relaxation properties. The linear actuator and the sample parallel spring guide are supported by an air bearing stage which is translated at a constant speed to conduct scratch tests for adhesion measurements. Based on the data reported in the paper, we find that microhardness and microviscoelastic properties at extremely low loads (or penetrations) are load (or penetration) dependent.

Tribological Characterization of the Nanostructured Thin Films Deposited by Intelligent Methods, for Mechatronic and Biomedical Applications

2016 ◽  
Vol 14 (11) ◽  
pp. 67-71
Author(s):  
Valentin Gornoava ◽  
Gheorghe Ion Gheorghe ◽  
Liliana-Laura Badita
Keyword(s):  
Thin Films ◽  
Biomedical Applications ◽  
Nanostructured Thin Films ◽  
Coated Surfaces ◽  
Functional Operation ◽  
Intelligent Methods ◽  
Tribological Characterization ◽  
Scratch Tests ◽  
Steel Substrates

Abstract The main objectives of the present project are to study and to improve mechanical properties of different systems from mechatronic and biomedical domains, in order to increase their functionality and life span. This is why nanostructured thin films (e.g. Al, Cr, Ti, Ti/Al multilayers) were deposited on different steel substrates, used in mechatronic and biomedical applications. By the characterization of coated surfaces of the products used in various fields such as medicine, mechatronics, electronics, etc. depends their proper operation, durability and reliability. This is the main reason why, we studied new types of layers and multilayers using Atomic Force Microscopy and scratch tests. The main result of the realized tests is that all studied nanostructured thin films offer the possibility of increasing the lifetime of substrates, being an important factor for proper functional operation, durability and reliability of the final systems in which they are used.

Microstructure and mechanical characterization of aluminum thin films on steel substrates

2019 ◽  
Vol 18 ◽  
pp. 2415-2421
Author(s):  
F.M. Mwema ◽  
E.T. Akinlabi ◽  
O.P. Oladijo ◽  
Maria P. Nikolova ◽  
Emil H. Yankov
Keyword(s):  
Thin Films ◽  
Mechanical Characterization ◽  
Steel Substrates

Electron microscopic characterization of diamond thin films and substrates for diamond heteroepitaxial growth

1989 ◽  
Vol 47 ◽  
pp. 592-593
Author(s):  
J.B. Posthill ◽  
R.P. Burns ◽  
R.A. Rudder ◽  
Y.H. Lee ◽  
R.J. Markunas ◽  
...  
Keyword(s):  
Thin Films ◽  
Wide Band ◽  
Deposition Process ◽  
Heteroepitaxial Growth ◽  
Electron Microscopic ◽  
Wide Band Gap ◽  
Lattice Matching ◽  
Different Types ◽  
Diamond Thin Films

Because of diamond’s wide band gap, high thermal conductivity, high breakdown voltage and high radiation resistance, there is a growing interest in developing diamond-based devices for several new and demanding electronic applications. In developing this technology, there are several new challenges to be overcome. Much of our effort has been directed at developing a diamond deposition process that will permit controlled, epitaxial growth. Also, because of cost and size considerations, it is mandatory that a non-native substrate be developed for heteroepitaxial nucleation and growth of diamond thin films. To this end, we are currently investigating the use of Ni single crystals on which different types of epitaxial metals are grown by molecular beam epitaxy (MBE) for lattice matching to diamond as well as surface chemistry modification. This contribution reports briefly on our microscopic observations that are integral to these endeavors.

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