Measurement accuracy analysis of the free carrier absorption determination of the electronic transport properties of silicon wafers

2011 ◽  
Vol 20 (6) ◽  
pp. 068105 ◽  
Author(s):  
Xi-Ren Zhang ◽  
Chun-Ming Gao ◽  
Ying Zhou ◽  
Zhan-Ping Wang
1980 ◽  
Vol 51 (5) ◽  
pp. 2659 ◽  
Author(s):  
W. Walukiewicz ◽  
J. Lagowski ◽  
L. Jastrzebski ◽  
P. Rava ◽  
M. Lichtensteiger ◽  
...  

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