Sensitivity analysis of laterally resolved free carrier absorption determination of electronic transport properties of silicon wafers

2008 ◽  
Vol 103 (3) ◽  
pp. 033709 ◽  
Author(s):  
Xiren Zhang ◽  
Bincheng Li ◽  
Chunming Gao
1980 ◽  
Vol 51 (5) ◽  
pp. 2659 ◽  
Author(s):  
W. Walukiewicz ◽  
J. Lagowski ◽  
L. Jastrzebski ◽  
P. Rava ◽  
M. Lichtensteiger ◽  
...  

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