scholarly journals In situ analysis of size distribution of nano-particles in reactive plasmas using two dimensional laser light scattering method

2012 ◽  
Vol 7 (04) ◽  
pp. C04017-C04017 ◽  
Author(s):  
K Kamataki ◽  
Y Morita ◽  
M Shiratani ◽  
K Koga ◽  
G Uchida ◽  
...  
Keyword(s):  
Light Scattering ◽  
Size Distribution ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Nano Particles ◽  
In Situ Analysis ◽  
Scattering Method ◽  
Two Dimensional

scholarly journals Analysis of the polydispersity of soil-like bodies in glacier environments by the laser light scattering (diffraction) method

2021 ◽  
Vol 66 (3) ◽  
Author(s):  
Evgeny Abakumov ◽  
Timur Nizamutdinov ◽  
Viacheslav Polyakov
Keyword(s):  
Particle Size ◽  
Light Scattering ◽  
Particle Size Distribution ◽  
Size Distribution ◽  
Laser Light ◽  
Diffraction Method ◽  
Laser Light Scattering ◽  
Scattering Method ◽  
Polar Regions ◽  
Laser Method

This study presents the results of polydispersity analysis of soil-like bodies from two various polar regions using the laser light scattering method. The differences in the particle size distribution of cryoconite samples from the Anuchin Glacier (Antarctica) and the Mushketov Glacier (Arctic) are described. The samples obtained from the Mushketov Glacier are characterized by a finer particle size distribution than samples collected on the Anuchin Glacier. While comparing our results with previously published studies, it was found that the method of laser light scattering shows a lower content of small fractions (<0.05 mm) compared to the classical methods of sedimentation, since these methods are based on fundamentally different physical principles. The laser method used requires low amounts of samples (0.2–0.5 g), while the classical sedimentary method uses a higher gravimetric portion of cryoconite (5–10 g), which is critical for field sampling.

In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells

1993 ◽  
Vol 324 ◽  
Author(s):  
C. Pickering ◽  
D.A.O. Hope ◽  
W.Y. Leong ◽  
D.J. Robbins ◽  
R. Greef
Keyword(s):  
Growth Rate ◽  
Light Scattering ◽  
Laser Light ◽  
Growth Period ◽  
Laser Light Scattering ◽  
Heterojunction Bipolar Transistor ◽  
Dual Wavelength ◽  
Multi Quantum Well ◽  
Refractive Index Data

AbstractIn-situ dual-wavelength ellipsometry and laser light scattering have been used to monitor growth of Si/Si1−x,Gex heterojunction bipolar transistor and multi-quantum well (MQW) structures. The growth rate of B-doped Si0 8Ge0.2 has been shown to be linear, but that of As-doped Si is non-linear, decreasing with time. Refractive index data have been obtained at the growth temperature for x = 0.15, 0.20, 0.25. Interface regions ∼ 6-20Å thickness have been detected at hetero-interfaces and during interrupted alloy growth. Period-to-period repeatability of MQW structures has been shown to be ±lML.

The Prognostic Value of Small-Sized Platelet Aggregates in Unstable Angina: Detection by a Novel Laser-Light Scattering Method

2001 ◽  
Vol 101 (3) ◽  
pp. 109-118 ◽  
Author(s):  
Ichiro Kajiwara ◽  
Hisao Ogawa ◽  
Hirofumi Soejima ◽  
Keiji Takazoe ◽  
Shinzo Miyamoto ◽  
...  
Keyword(s):  
Light Scattering ◽  
Unstable Angina ◽  
Prognostic Value ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Scattering Method ◽  
Platelet Aggregates
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