X-ray micro-beam characterization of a small pixel spectroscopic CdTe detector

2012 ◽  
Vol 7 (07) ◽  
pp. P07017-P07017 ◽  
Author(s):  
M C Veale ◽  
S J Bell ◽  
P Seller ◽  
M D Wilson ◽  
V Kachkanov
2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Felix Hofmann ◽  
Brian Abbey ◽  
Wenjun Liu ◽  
Ruqing Xu ◽  
Brian F. Usher ◽  
...  

2013 ◽  
Author(s):  
G. Vacanti ◽  
M. Ackermann ◽  
M. Vervest ◽  
M. Collon ◽  
R. Günther ◽  
...  

2013 ◽  
Vol 4 (1) ◽  
Author(s):  
Felix Hofmann ◽  
Brian Abbey ◽  
Wenjun Liu ◽  
Ruqing Xu ◽  
Brian F. Usher ◽  
...  

2017 ◽  
Vol 32 (S2) ◽  
pp. S22-S27 ◽  
Author(s):  
Dubravka Šišak Jung ◽  
Tilman Donath ◽  
Oxana Magdysyuk ◽  
Jozef Bednarcik

Characterization of semi and noncrystalline materials, monitoring structural phase transitions in situ, and obtaining structural information together with spatial distribution of the investigated material are only a few applications that hugely benefitted from the combination of high-energy X-rays and modern algorithms for data processing. This work examines the possibility of advancing these applications by shortening the data acquisition and improving the data quality by using the new high-energy PILATUS3 CdTe detector.


Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.


Author(s):  
L. T. Germinario

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.


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