Beam tracking with micromegas & wire chambers in secondary electron detection configuration

2013 ◽  
Vol 8 (12) ◽  
pp. C12023-C12023 ◽  
Author(s):  
M Voštinar ◽  
B Fernández ◽  
J Pancin ◽  
M A G Alvarez ◽  
T Chaminade ◽  
...  
Keyword(s):  
Secondary Electron ◽  
Electron Detection ◽  
Beam Tracking ◽  
Wire Chambers

scholarly journals Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

2011 ◽  
Vol 17 (S2) ◽  
pp. 1212-1213 ◽  
Author(s):  
J Chuah ◽  
D Holburn
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Photon Detector ◽  
Electron Detection ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Secondary Electron Detection in a Field Emission Scanning Microscope

1969 ◽  
Vol 27 ◽  
pp. 16-17
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
Field Emission ◽  
Secondary Electron ◽  
Mechanical Design ◽  
Beam Current ◽  
Beam Diameter ◽  
Scanning Microscope ◽  
Secondary Electrons ◽  
Electron Detection ◽  
High Beam Current ◽  
Working Distance

A scanning microscope using only a field emission gun, without auxiliary lenses, has been described elsewhere. It has been shown capable of 100 Å resolution using transmitted electrons with a beam current of 10-10 amps. Detectors have now been installed to test its performance using secondary electrons.Detection of secondary electrons in this microscope differs in some ways from detection in a conventional scanning microscope. First, the operating vacuum of 10-9 to 10-10 Torr places restrictions on detector construction and materials. Second, the high beam current reduces the noise restrictions on detector and amplifier. Third, the large possible working distance (up to ∿ 8 cm for a beam diameter of 200 Å) increases flexibility in the mechanical design.

scholarly journals Advantages of Energy Selective Secondary Electron Detection in SEM

2010 ◽  
Vol 16 (S2) ◽  
pp. 622-623
Author(s):  
C Rodenburg ◽  
MAE Jepson ◽  
E Bosch
Keyword(s):  
Secondary Electron ◽  
Electron Detection

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Sign in / Sign up

Export Citation Format

Share Document