Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope
2011 ◽
Vol 17
(S2)
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pp. 1212-1213
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Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
1995 ◽
Vol 363
(1-2)
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pp. 270-275
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1999 ◽
Vol 38
(Part 1, No. 3A)
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pp. 1575-1579
1988 ◽
Vol 46
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pp. 202-203
1986 ◽
Vol 44
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pp. 652-653
1997 ◽
Vol 3
(S2)
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pp. 385-386
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