scholarly journals X-ray tomography based numerical analysis of stress concentrations in non-crimp fabric reinforced composites - assessment of segmentation methods

2020 ◽  
Vol 942 ◽  
pp. 012038 ◽  
Author(s):  
R M Auenhammer ◽  
L P Mikkelsen ◽  
L E Asp ◽  
B J Blinzler
Keyword(s):  
Numerical Analysis ◽  
Reinforced Composites ◽  
Stress Concentrations ◽  
X Ray ◽  
Segmentation Methods

Phase identification in SiC whisker reinforced Al2O3-R2O3-based composites

1992 ◽  
Vol 50 (1) ◽  
pp. 152-153
Author(s):  
C.M. Sung ◽  
K.J. Ostreicher ◽  
M.L. Huckabee ◽  
S.T. Buljan
Keyword(s):  
Analytical Electron Microscopy ◽  
Phase Identification ◽  
Reinforced Composites ◽  
Ion Milling ◽  
X Ray ◽  
Binary Oxides ◽  
Analytical Electron ◽  
The Matrix ◽  
Second Phases ◽  
Convergent Beam

A series of binary oxides and SiC whisker reinforced composites both having a matrix composed of an α-(Al, R)2O3 solid solution (R: rare earth) have been studied by analytical electron microscopy (AEM). The mechanical properties of the composites as well as crystal structure, composition, and defects of both second phases and the matrix were investigated. The formation of various second phases, e.g. garnet, β-Alumina, or perovskite structures in the binary Al2O3-R2O3 and the ternary Al2O3-R2O3-SiC(w) systems are discussed.Sections of the materials having thicknesses of 100 μm - 300 μm were first diamond core drilled. The discs were then polished and dimpled. The final step was ion milling with Ar+ until breakthrough occurred. Samples prepared in this manner were then analyzed using the Philips EM400T AEM. The low-Z energy dispersive X-ray spectroscopy (EDXS) data were obtained and correlated with convergent beam electron diffraction (CBED) patterns to identify phase compositions and structures. The following EDXS parameters were maintained in the analyzed areas: accelerating voltage of 120 keV, sample tilt of 12° and 20% dead time.

Numerical analysis of shift error in X-ray phase contrast imaging for large field of view

2017 ◽  
Vol 34 (1) ◽  
pp. 8
Author(s):  
Jianheng Huang ◽  
Yaohu Lei ◽  
Xin Liu ◽  
Jinchuan Guo ◽  
Ji Li ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
Phase Contrast ◽  
Field Of View ◽  
Phase Contrast Imaging ◽  
Large Field ◽  
Contrast Imaging ◽  
X Ray

X-ray topo-tomography studies of linear dislocations in silicon single crystals

2018 ◽  
Vol 51 (6) ◽  
pp. 1616-1622 ◽  
Author(s):  
Victor Asadchikov ◽  
Alexey Buzmakov ◽  
Felix Chukhovskii ◽  
Irina Dyachkova ◽  
Denis Zolotov ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
High Resolution ◽  
Single Crystals ◽  
Complete Characterization ◽  
Reconstruction Technique ◽  
Algebraic Reconstruction Technique ◽  
X Ray ◽  
Laboratory Setup ◽  
Simultaneous Algebraic Reconstruction Technique

This article describes complete characterization of the polygonal dislocation half-loops (PDHLs) introduced by scratching and subsequent bending of an Si(111) crystal. The study is based on the X-ray topo-tomography technique using both a conventional laboratory setup and the high-resolution X-ray image-detecting systems at the synchrotron facilities at KIT (Germany) and ESRF (France). Numerical analysis of PDHL images is performed using the Takagi–Taupin equations and the simultaneous algebraic reconstruction technique (SART) tomographic algorithm.

Experimental and numerical analysis of a plasma collision by x-ray spectroscopy and imaging

1995 ◽  
Vol 54 (1-2) ◽  
pp. 105-112 ◽  
Author(s):  
C. Chenais-Popovics ◽  
O. Rancu ◽  
P. Renaudin ◽  
H. Kawagoshi ◽  
J.C. Gauthier ◽  
...  
Keyword(s):  
Numerical Analysis ◽  
X Ray

scholarly journals Energy-based binary segmentation of snow microtomographic images

2013 ◽  
Vol 59 (217) ◽  
pp. 859-873 ◽  
Author(s):  
Pascal Hagenmuller ◽  
Guillaume Chambon ◽  
Bernard Lesaffre ◽  
Frédéric Flin ◽  
Mohamed Naaim
Keyword(s):  
Spatial Information ◽  
A Priori ◽  
Synthetic Image ◽  
X Ray ◽  
Require Time ◽  
Segmentation Methods ◽  
Binary Segmentation ◽  
Data Fidelity ◽  
Local Spatial Information

AbstractX-ray microtomography has become an essential tool for investigating the mechanical and physical properties of snow, which are tied to its microstructure. To allow a quantitative characterization of the microstructure, the grayscale X-ray attenuation coefficient image has to be segmented into a binary ice/pore image. This step, called binary segmentation, is crucial and affects all subsequent analysis and modeling. Common segmentation methods are based on thresholding. In practice, these methods present some drawbacks and often require time-consuming manual post-processing. Here we present a binary segmentation algorithm based on the minimization of a segmentation energy. This energy is composed of a data fidelity term and a regularization term penalizing large interface area, which is of particular interest for snow where sintering naturally tends to reduce the surface energy. The accuracy of the method is demonstrated on a synthetic image. The method is then successfully applied on microtomographic images of snow and compared to the threshold-based segmentation. The main advantage of the presented approach is that it benefits from local spatial information. Moreover, the effective resolution of the segmented image is clearly defined and can be chosen a priori.

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