Soft sample deformation, damage and induced electromechanical property changes in contact- and tapping-mode atomic force microscopy
2020 ◽
Vol 8
(4)
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pp. 045004
M A S R Saadi
◽
Berkin Uluutku
◽
Cameron H Parvini
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Santiago D Solares
1999 ◽
Vol 75
(26)
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pp. 4198-4200
◽
G. Bar
◽
L. Delineau
◽
R. Brandsch
◽
M. Bruch
◽
M.-H. Whangbo
2007 ◽
Vol 78
(10)
◽
pp. 103707
◽
1998 ◽
Vol 14
(26)
◽
pp. 7343-7347
◽
Georg Bar
◽
Rainer Brandsch
◽
Myung-Hwan Whangbo
1999 ◽
Vol 15
(25)
◽
pp. 8569-8573
◽
William E. Farneth
◽
R. Scott McLean
◽
John D. Bolt
◽
Eleni Dokou
◽
Mark A. Barteau
2004 ◽
Vol 425
(1)
◽
pp. 61-67
K. H. Jung
◽
H. K. Shin
◽
Y. S. Kwon
◽
H. Kim
◽
C. Kim
Mary K. Cowman
◽
Min Li
◽
Ansil Dyal
◽
Sonoko Kanai
2020 ◽
Vol 31
(45)
◽
pp. 455502
◽
Nurul Huda Shaik
◽
Ronald G Reifenberger
◽
Arvind Raman
1997 ◽
Vol 320
(8)
◽
pp. 637-643
◽
Christian Le Gnimellec
◽
Éric Lesniewska
◽
Marie-Cécile Giocondi
◽
Éric Finot
◽
Jean-Pierre Goudonnet