Phase plates in the transmission electron microscope: operating principles and applications

Abstract In this paper, we review the current state of phase plate imaging in a transmission electron microscope (TEM). We focus especially on the hole-free phase plate (HFPP) design, also referred to as the Volta phase plate (VPP). We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the HFPP.

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Reconstruction of electron holograms recorded in a non-FEG, non-biprism TEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100139469 ◽

1995 ◽

Vol 53 ◽

pp. 618-619

Author(s):

Z.L. Wang

Keyword(s):

Electron Microscope ◽

Single Crystal ◽

Experimental Technique ◽

Transmission Electron Microscope ◽

The Other ◽

Electron Holography ◽

Transmission Electron ◽

Coherent Sources ◽

Imaging Theory ◽

Normal Specimen

An experimental technique for performing electron holography using a non-FEG, non-biprism transmission electron microscope (TEM) has been introduced by Ru et al. A double stacked specimens, one being a single crystal foil and the other the specimen, are loaded in the normal specimen position in TEM. The single crystal, which is placed onto the specimen, is responsible to produce two beams that are equivalent to two virtual coherent sources illuminating the specimen beneath, thus, permitting electron holography of the specimen. In this paper, the imaging theory of this technique is described. Procedures are introduced for digitally reconstructing the holograms.

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Fabrication of a Boersch phase plate for phase contrast imaging in a transmission electron microscope

Review of Scientific Instruments ◽

10.1063/1.2179411 ◽

2006 ◽

Vol 77 (3) ◽

pp. 033701 ◽

Cited By ~ 53

Author(s):

K. Schultheiß ◽

F. Pérez-Willard ◽

B. Barton ◽

D. Gerthsen ◽

R. R. Schröder

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Contrast ◽

Phase Contrast Imaging ◽

Phase Plate ◽

Contrast Imaging ◽

Transmission Electron

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Effect of a physical phase plate on contrast transfer in an aberration-corrected transmission electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2008.02.009 ◽

2008 ◽

Vol 108 (9) ◽

pp. 878-884 ◽

Cited By ~ 15

Author(s):

B. Gamm ◽

K. Schultheiß ◽

D. Gerthsen ◽

R.R. Schröder

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Plate ◽

Transmission Electron ◽

Aberration Corrected

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Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2009.11.016 ◽

2010 ◽

Vol 110 (5) ◽

pp. 563-570 ◽

Cited By ~ 25

Author(s):

D. Alloyeau ◽

W.K. Hsieh ◽

E.H. Anderson ◽

L. Hilken ◽

G. Benner ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Plate ◽

Hard Materials ◽

Transmission Electron

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First steps towards a combination of aberration correction and physical phase plates in a transmission electron microscope

10.22443/rms.emc2020.156 ◽

2021 ◽

Author(s):

Simon Hettler ◽

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Aberration Correction ◽

Transmission Electron ◽

Phase Plates

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Enhanced phase contrast transfer using ptychography combined with a pre-specimen phase plate in a scanning transmission electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2016.09.002 ◽

2016 ◽

Vol 171 ◽

pp. 117-125 ◽

Cited By ~ 18

Author(s):

Hao Yang ◽

Peter Ercius ◽

Peter D. Nellist ◽

Colin Ophus

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Contrast ◽

Scanning Transmission Electron Microscope ◽

Phase Plate ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

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Optimisation of Phase Contrast in a Transmission Electron Microscope with a Physical Phase Plate and Cs-Corrector

Microscopy and Microanalysis ◽

10.1017/s1431927607080051 ◽

2007 ◽

Vol 13 (S03) ◽

Author(s):

B Gamm ◽

K Schultheiss ◽

D Gerthsen ◽

R R Schröder

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Contrast ◽

Phase Plate ◽

Transmission Electron

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Toward the quantitative the interpretation of hole-free phase plate images in a transmission electron microscope.

Ultramicroscopy ◽

10.1016/j.ultramic.2019.112875 ◽

2020 ◽

Vol 209 ◽

pp. 112875

Author(s):

Ken Harada ◽

Marek Malac ◽

Misa Hayashida ◽

Koudai Niitsu ◽

Keiko Shimada ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Phase Plate ◽

Transmission Electron

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Incoherent imaging of thin specimens using coherently scattered electrons

Proceedings of the Royal Society of London. Series A: Mathematical and Physical Sciences ◽

10.1098/rspa.1993.0060 ◽

1993 ◽

Vol 441 (1912) ◽

pp. 261-281 ◽

Cited By ~ 104

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Optical Axis ◽

Scanning Transmission Electron Microscope ◽

Interference Effects ◽

Transmission Electron ◽

Scanning Transmission ◽

Imaging Theory ◽

Annular Detector ◽

Incoherent Imaging

We consider the imaging of phase objects using a scanning transmission electron microscope equipped with a large inner-angle annular detector. We show, contrary to popular expectation, that incoherent imaging theory can be used to describe the imaging process in a plane perpendicular to the optical axis. Interference effects between atoms possessing the same projected coordinates must, however, be considered explicitly.

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