scholarly journals Sir Robert William Kerr Honeycombe KBE. 2 May 1921—14 September 2007

2009 ◽  
Vol 55 ◽  
pp. 91-106 ◽  
Author(s):  
R. E. Smallman
Keyword(s):  
State Of The Art ◽  
Microstructural Characterization ◽  
University Education ◽  
Research Experience ◽  
Interphase Precipitation ◽  
Transmission Electron ◽  
Alloy Steels ◽  
The Uk ◽  
The University

Although Robert Honeycombe was born in Melbourne, Australia, where he received his university education and gained valuable research experience at the Council for Scientific and Industrial Research, it was in the UK that his distinguished career developed. At Sheffield he harnessed the newly emerging technique of transmission electron microscopy to the microstructural study of alloy steels. Moving to Cambridge, he built up a world-renowned team in this area. His seminal work was the characterization of interphase precipitation at the α/γboundary interface, which had a perceptible impact on the production of micro-alloyed steels throughout the world. As Goldsmiths' Professor of Metallurgy he was the longest-serving head of the department, broadening its coverage into material science to include ceramics and polymers as well as reinforcing the traditional areas of mechanical behaviour and processing. All these activities were underpinned by state-of-the-art microstructural characterization. Robert had an open and warm personality and was a natural leader of the profession within the university, in learned societies and in government and research council bodies. Above all he was a great supporter of young researchers, not only at Cambridge but also throughout the country.

Microstructural characterization of a cast RENi5-based alloy

1993 ◽  
Vol 51 ◽  
pp. 1176-1177
Author(s):  
G. M. Micha ◽  
L. Zhang
Keyword(s):  
Electron Microscopy ◽  
Rare Earth ◽  
Microstructural Characterization ◽  
Binary Compound ◽  
Nickel Metal ◽  
Cast Material ◽  
Nickel Metal Hydride ◽  
Transmission Electron ◽  
Cast Condition

RENi5 (RE: rare earth) based alloys have been extensively evaluated for use as an electrode material for nickel-metal hydride batteries. A variety of alloys have been developed from the prototype intermetallic compound LaNi5. The use of mischmetal as a source of rare earth combined with transition metal and Al substitutions for Ni has caused the evolution of the alloy from a binary compound to one containing eight or more elements. This study evaluated the microstructural features of a complex commercial RENi5 based alloy using scanning and transmission electron microscopy.The alloy was evaluated in the as-cast condition. Its chemistry in at. pct. determined by bulk techniques was 12.1 La, 3.2 Ce, 1.5 Pr, 4.9 Nd, 50.2 Ni, 10.4 Co, 5.3 Mn and 2.0 Al. The as-cast material was of low strength, very brittle and contained a multitude of internal cracks. TEM foils could only be prepared by first embedding pieces of the alloy in epoxy.

Microstructural Characterization of Ni-Al Alloyed Layer under Laser Rapid Solidification Condition

2011 ◽  
Vol 328-330 ◽  
pp. 565-568
Author(s):  
Yue Yang ◽  
Hua Wu
Keyword(s):  
Cross Section ◽  
Pulsed Laser ◽  
Microstructural Characterization ◽  
Eutectic Growth ◽  
Nickel Layer ◽  
Solidification Condition ◽  
Melted Zone ◽  
Transmission Electron ◽  
Pulsed Laser Irradiation

Nickel layer electroless deposited on aluminum substrate was alloyed by Nd-YAG pulsed laser irradiation. Solidification microstructure was characterized through cross section, showing typical microstructure that were located in upper and middle melted zone and interface of melted pool and substrate, respectively. The microstructure was analyzed by transmission electron microscopy (TEM). Followed by the observations, the eutectic growth process was analyzed.

Microstructural Characterization of Pt/Ti and RuO2 Electrodes on SiO2/Si Annealed in the Oxygen Ambient

1996 ◽  
Vol 433 ◽  
Author(s):  
Jeong Soo Lee ◽  
Hyun JA Kwon ◽  
Young Woo Jeong ◽  
Hyun HA Kim ◽  
Kyu HO Park ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Film Surface ◽  
Microstructural Characterization ◽  
Silicide Phase ◽  
X Ray Diffraction ◽  
Transmission Electron ◽  
Degree Of Oxidation ◽  
Thin Interlayer ◽  
Increasing Temperature

AbstractMicrostructures and interdiffusions of Pt/Ti/SiO2/Si and RuO2/SiO2/Si during annealing in O2 were investigated using x-ray diffraction, Auger electron spectroscopy, scanning electron microscopy, and transmission electron microscopy. The degree of oxidation and the interdiffusion of elements have remarkably increased with increasing temperature above 500 °C for the Pt/Ti/SiO2/Si case. The generation of Pt hillocks commenced at 500 °C. The Pt-silicide phase was also observed near the TiOx/SiO2 interface. The microstructural variations occurred to only a small amount for the RuO2/SiO2/Si case over the temperature range 300 – 700 °C. While there was no hillock formation, the RuO2 film surface was roughened by the thermal grooving phenomenon. A thin interlayer phase was found at the RuO2/SiO2 interface.

Microstructure and Properties of Nanosemicrystalline Si3N4 Ceramics with Doped Sintering Additives: Part I. Microstructural Characterization of Nanosemicrystalline Si3N4 Powders

1998 ◽  
Vol 13 (9) ◽  
pp. 2580-2587 ◽  
Author(s):  
K. H. Ryu ◽  
J-M. Yang
Keyword(s):  
Microstructural Characterization ◽  
Degree Of Crystallinity ◽  
Chemical Compositions ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sintering Additives ◽  
Transmission Electron ◽  
Wet Chemical ◽  
Si3n4 Ceramics

The characteristics of nanosized silicon nitride powders with doped Y2O3 and Al2O3 fabricated by a plasma-reacted chemical process were investigated. The chemical compositions of the powders were analyzed by wet chemical analysis. The morphology and the size distribution were determined by transmission electron microscopy (TEM). TEM with energy dispersive spectroscopy (EDS) was used to verify the existence of sintering additives in each individual particle. The crystal structure of the powders was identified by the selected area diffraction pattern (SADP). X-ray diffraction (XRD) technique was used for phase analysis and the measurement of degree of crystallinity. The characteristics of chemical bonding was analyzed by using Fourier transform infrared spectroscopy (FTIR).

Microstructural Characterization of a Fe-Based Compostie Reinforced by TiC

2011 ◽  
Vol 675-677 ◽  
pp. 835-838
Author(s):  
Jing Wang ◽  
Si Jing Fu ◽  
Hong Cheng
Keyword(s):  
Electron Microscope ◽  
Microstructural Characterization ◽  
Interfacial Structure ◽  
Synthesis Reaction ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Tic Particle ◽  
Scanning Electron

The present work reported the preparation of TiC/Fe-based composite by the synthesis reaction from Ti, C and Fe. The sintered composites were characterized by X-ray diffraction, scanning electron microscope and transmission electron microscope. TiC, Fe3C and α-Fe were detected by X-ray diffraction analysis. The scanning and transmission electron micrographs revealed the morphology and distribution of the reinforcements, the microstructure of Fe matrix, the interfacial structure of TiC particle-to-Fe matrix. Moreover, the formation reason of the voids in composite was also discussed.

TEM Study of AlGaN/GaN on Hexagonal SiC Substrates

2014 ◽  
Vol 936 ◽  
pp. 656-660
Author(s):  
Alexandra Gkanatsiou ◽  
Christos B. Lioutas ◽  
Nikolaos Frangis ◽  
Narendraraj Chandraraj ◽  
Efstathios K. Polychroniadis ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Tem Characterization ◽  
Transmission Electron ◽  
Surface Undulation

The present work concerns the microstructural characterization of a multi-component (based on GaN and related materials) and multi-layered (5 layers) film, grown on 6H-SiC substrate (with a misorientation of 1 degree off from the (0001) plane), using transmission electron microscopy (TEM). The TEM characterization showed no surface undulation, despite the presence of steps in the SiC/AlN interface.

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