ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
In situstructural study of thin-film growth by quick-scanning extended x-ray-absorption spectroscopy
Physical Review B
◽
10.1103/physrevb.44.2822
◽
1991
◽
Vol 44
(6)
◽
pp. 2822-2825
◽
Cited By ~ 17
Author(s):
R. Frahm
◽
T. W. Barbee
◽
W. Warburton
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Film Growth
◽
Thin Film Growth
◽
X Ray
◽
X Ray Absorption
Download Full-text
Related Documents
Cited By
References
Resolving the Evolution of Atomic Layer-Deposited Thin-Film Growth by Continuous In Situ X-Ray Absorption Spectroscopy
Chemistry of Materials
◽
10.1021/acs.chemmater.0c04547
◽
2021
◽
Author(s):
Xiaohui Qu
◽
Danhua Yan
◽
Ruoshui Li
◽
Jiajie Cen
◽
Chenyu Zhou
◽
...
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Film Growth
◽
Atomic Layer
◽
Thin Film Growth
◽
X Ray
◽
X Ray Absorption
Download Full-text
Early stages of TiN thin film growth probed using in-situ soft X-ray absorption spectroscopy
10.1063/1.4980541
◽
2017
◽
Cited By ~ 1
Author(s):
Rachana Gupta
◽
Mukul Gupta
◽
D. M. Phase
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Film Growth
◽
Thin Film Growth
◽
X Ray
◽
Early Stages
◽
X Ray Absorption
Download Full-text
In-situ investigation of Bi thin film condensation by surface sensitive X-ray absorption spectroscopy at cryogenic temperatures
Journal of Physics Conference Series
◽
10.1088/1742-6596/190/1/012114
◽
2009
◽
Vol 190
◽
pp. 012114
◽
Cited By ~ 1
Author(s):
D Lützenkirchen-Hecht
◽
C Markert
◽
R Wagner
◽
R Frahm
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Film Condensation
◽
Cryogenic Temperatures
◽
X Ray
◽
In Situ Investigation
◽
X Ray Absorption
Download Full-text
Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy
Journal of Applied Physics
◽
10.1063/1.3190478
◽
2009
◽
Vol 106
(3)
◽
pp. 034108
◽
Cited By ~ 12
Author(s):
H. Bouyanfif
◽
J. Wolfman
◽
M. El Marssi
◽
Y. Yuzyuk
◽
R. Bodeux
◽
...
Keyword(s):
Thin Film
◽
Raman Spectroscopy
◽
Film Growth
◽
Thin Film Growth
◽
Tio3 Thin Film
◽
X Ray Diffraction
◽
X Ray
Download Full-text
In situ X-ray reflectivity measurement of thin film growth during vacuum deposition
Applied Surface Science
◽
10.1016/0169-4332(95)00242-1
◽
1996
◽
Vol 92
◽
pp. 282-286
◽
Cited By ~ 5
Author(s):
Chih-Hao Lee
◽
Sung-Yuh Tseng
Keyword(s):
Thin Film
◽
Film Growth
◽
Thin Film Growth
◽
Vacuum Deposition
◽
Reflectivity Measurement
◽
X Ray
Download Full-text
Examination of the structure and melting behaviour of thin film n-alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy
Journal of the Chemical Society Faraday Transactions
◽
10.1039/ft9969200783
◽
1996
◽
Vol 92
(5)
◽
pp. 783
◽
Cited By ~ 11
Author(s):
Gerry P. Hastie
◽
Joy Johnstone
◽
Kevin J. Roberts
◽
Dan Fischer
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Melting Behaviour
◽
X Ray
◽
X Ray Absorption
Download Full-text
Soft x-ray spectrometer for in situ monitoring of thin-film growth
10.1117/12.193191
◽
1994
◽
Cited By ~ 1
Author(s):
Per Skytt
◽
Carl J. Englund
◽
Nial Wassdahl
◽
Derrick C. Mancini
◽
Joseph Nordgren
Keyword(s):
Thin Film
◽
Film Growth
◽
Thin Film Growth
◽
In Situ Monitoring
◽
X Ray
Download Full-text
X-ray diffraction analysis of YBaCuO ultra-thin film growth
Journal of Alloys and Compounds
◽
10.1016/s0925-8388(96)02770-3
◽
1997
◽
Vol 251
(1-2)
◽
pp. 65-69
◽
Cited By ~ 2
Author(s):
G. Linker
◽
D. Hüttner
◽
O. Meyer
◽
M. Ohkubo
◽
J. Reiner
Keyword(s):
Thin Film
◽
Diffraction Analysis
◽
Film Growth
◽
Thin Film Growth
◽
X Ray Diffraction
◽
X Ray
◽
Ultra Thin Film
Download Full-text
Electronic and atomic structures of Si–C–N thin film by X-ray-absorption spectroscopy
Journal of Electron Spectroscopy and Related Phenomena
◽
10.1016/s0368-2048(98)00111-x
◽
1998
◽
Vol 92
(1-3)
◽
pp. 115-118
◽
Cited By ~ 2
Author(s):
W.F Pong
◽
Y.K Chang
◽
H.H Hsieh
◽
M.-H Tsai
◽
K.H Lee
◽
...
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
X Ray
◽
Atomic Structures
◽
X Ray Absorption
Download Full-text
NiO-like single layer formed on a Ni/Cu(001) thin film revealed by the depth-resolved x-ray absorption spectroscopy
Applied Physics Letters
◽
10.1063/1.3531668
◽
2011
◽
Vol 98
(1)
◽
pp. 012501
◽
Cited By ~ 19
Author(s):
Kenta Amemiya
◽
Masako Sakamaki
Keyword(s):
Thin Film
◽
Absorption Spectroscopy
◽
Single Layer
◽
X Ray
◽
X Ray Absorption
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close