scholarly journals Stacking-order dependence in thermoelectric transport of biased trilayer graphene

2012 ◽  
Vol 86 (11) ◽  
Author(s):  
R. Ma ◽  
L. Sheng ◽  
M. Liu ◽  
D. N. Sheng
2017 ◽  
Vol 07 (07) ◽  
pp. 329-336
Author(s):  
Toshiki Matsuzaki ◽  
Huangyi Qin ◽  
Kenji Harada

2011 ◽  
Vol 84 (16) ◽  
Author(s):  
S. H. Jhang ◽  
M. F. Craciun ◽  
S. Schmidmeier ◽  
S. Tokumitsu ◽  
S. Russo ◽  
...  

2015 ◽  
Vol 117 (17) ◽  
pp. 17D901 ◽  
Author(s):  
Sang-Il Kim ◽  
Dong-Jun Kim ◽  
Min-Su Seo ◽  
Byong-Guk Park ◽  
Seung-Young Park

2013 ◽  
Vol 27 (07) ◽  
pp. 1361004 ◽  
Author(s):  
RONG MA

We numerically study the thermoelectric transport properties in trilayer graphene in the presence of a strong perpendicular magnetic field and disorder. In the unbiased case, we find that the thermoelectric transport has similar properties as in monolayer graphene. In the high temperature regime, the transverse thermoelectric conductivity αxy saturates to a universal value 8.31 kBe/h at the center of each Landau level (LL), and displays a linear temperature dependence at low temperatures. The Nernst signal has a peak at the central LL with a height of the order of kB/e, while the thermopower changes sign. We attribute this to the coexistence of particle and hole LLs around the Dirac point. When a finite interlayer bias is applied and a band gap is opened, it is found that the transport properties are consistent with those of a band insulator.


2013 ◽  
Vol 4 (1) ◽  
Author(s):  
Wenjing Zhang ◽  
Jiaxu Yan ◽  
Chang-Hsiao Chen ◽  
Liu Lei ◽  
Jer-Lai Kuo ◽  
...  

2011 ◽  
Vol 399 (1-2) ◽  
pp. 22-27 ◽  
Author(s):  
Kunchaya Pruethiarenun ◽  
Toshihiro Isobe ◽  
Sachiko Matsushita ◽  
Akira Nakajima

RSC Advances ◽  
2015 ◽  
Vol 5 (98) ◽  
pp. 80410-80414 ◽  
Author(s):  
Yi-Ping Lin ◽  
Chiun-Yan Lin ◽  
Cheng-Pong Chang ◽  
Min-Fa Lin

The magneto-optical spectra of ABC-stacked trilayer graphene are enriched by an electric field, providing a way to experimentally identify the stacking order of few layer graphene systems.


Author(s):  
Bernd Tesche ◽  
Tobias Schilling

The objective of our work is to determine:a) whether both of the imaging methods (TEM, STM) yield comparable data andb) which method is better suited for a reliable structure analysis of microclusters smaller than 1.5 nm, where a deviation of the bulk structure is expected.The silver was evaporated in a bell-jar system (p 10−5 pa) and deposited onto a 6 nm thick amorphous carbon film and a freshly cleaved highly oriented pyrolytic graphite (HOPG).The average deposited Ag thickness is 0.1 nm, controlled by a quartz crystal microbalance at a deposition rate of 0.02 nm/sec. The high resolution TEM investigations (100 kV) were executed by a hollow-cone illumination (HCI). For the STM investigations a commercial STM was used. With special vibration isolation we achieved a resolution of 0.06 nm (inserted diffraction image in Fig. 1c). The carbon film shows the remarkable reduction in noise by using HCI (Fig. 1a). The HOPG substrate (Fig. 1b), cleaved in sheets thinner than 30 nm for the TEM investigations, shows the typical arrangement of a nearly perfect stacking order and varying degrees of rotational disorder (i.e. artificial single crystals). The STM image (Fig. 1c) demonstrates the high degree of order in HOPG with atomic resolution.


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