scholarly journals 360∘ domain walls in magnetic thin films with uniaxial and random anisotropy

2018 ◽  
Vol 98 (13) ◽  
Author(s):  
N. Chowdhury ◽  
W. Kleemann ◽  
O. Petracic ◽  
F. Kronast ◽  
A. Doran ◽  
...  
2005 ◽  
Vol 17 (10) ◽  
pp. 1711-1718 ◽  
Author(s):  
Florin Radu ◽  
Vincent Leiner ◽  
Kurt Westerholt ◽  
Hartmut Zabel ◽  
Jeffery McCord ◽  
...  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Yoshinobu Nakatani ◽  
Keisuke Yamada ◽  
Atsufumi Hirohata

Abstract Magnetic Skyrmions are energetically stable entities formed in a ferromagnet with a diameter of typically below 100 nm and are easily displaceable using an electrical current of 102 A/cm2, resulting the Skyrmions to be more advantageous than domain walls for spintronic memory applications. Here, we demonstrated switching of a chirality of magnetic Skyrmions formed in magnetic thin films by introducing a pulsed heat spot using micromagnetic simulation. Skyrmions are found to expand with a pulsed heat spot, which induces the magnetic moments surrounding the Skyrmion to rotate by this expansion, followed by the chirality switching of the Skyrmion. Such simple controllability can be used as a fundamental building block for memory and logic devices using the chirality of Skyrmions as a data bit.


Author(s):  
L. Tang ◽  
G. Thomas ◽  
M. R. Khan ◽  
S. L. Duan

Cr thin films are often used as underlayers for Co alloy magnetic thin films, such as Co1, CoNi2, and CoNiCr3, for high density longitudinal magnetic recording. It is belived that the role of the Cr underlayer is to control the growth and texture of the Co alloy magnetic thin films, and, then, to increase the in plane coercivity of the films. Although many epitaxial relationship between the Cr underlayer and the magnetic films, such as ﹛1010﹜Co/ {110﹜Cr4, ﹛2110﹜Co/ ﹛001﹜Cr5, ﹛0002﹜Co/﹛110﹜Cr6, have been suggested and appear to be related to the Cr thickness, the texture of the Cr underlayer itself is still not understood very well. In this study, the texture of a 2000 Å thick Cr underlayer on Nip/Al substrate for thin films of (Co75Ni25)1-xTix dc-sputtered with - 200 V substrate bias is investigated by electron microscopy.


2008 ◽  
Vol 42 (2) ◽  
pp. 125-128
Author(s):  
J. F. Al-Sharab ◽  
J. E. Wittig ◽  
G. Bertero ◽  
T. Yamashita ◽  
J. Bentley ◽  
...  

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  

2010 ◽  
Vol 46 (2) ◽  
pp. 630-633 ◽  
Author(s):  
Zung-Hang Wei ◽  
Chi-Kuen Lo ◽  
Da-Ren Liu ◽  
Yi-Ping Hsieh ◽  
Yun-Ruei Lee ◽  
...  

2003 ◽  
Vol 91 (9) ◽  
Author(s):  
Andreas Moser ◽  
Andreas Berger ◽  
David T. Margulies ◽  
Eric E. Fullerton

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