scholarly journals Laser-assisted decay spectroscopy and mass spectrometry of Au178

2020 ◽  
Vol 102 (4) ◽  
Author(s):  
J. G. Cubiss ◽  
A. N. Andreyev ◽  
A. E. Barzakh ◽  
V. Manea ◽  
M. Al Monthery ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Decay Spectroscopy

MASS AND LIFETIME MEASUREMENTS AT THE PRESENT ESR FACILITY

2009 ◽  
Vol 18 (02) ◽  
pp. 323-334 ◽  
Author(s):  
YURI A. LITVINOV
Keyword(s):  
Mass Spectrometry ◽  
Single Particle ◽  
Experimental Methods ◽  
Lifetime Measurements ◽  
Time Resolved ◽  
Particle Decay ◽  
Decay Properties ◽  
Decay Spectroscopy ◽  
Beta Decays ◽  
Charged Ions

Mass and lifetime measurements of stored exotic nuclei is one of the successful experimental programs at the FRS-ESR facility of GSI, Darmstadt. Two experimental techniques, namely Isochronous and time-resolved Schottky mass spectrometry have been developed. Nuclides in a very broad range of half-lives starting from stable down to only a few ten microseconds can be addressed. Single stored ions can be measured which makes these techniques highly efficient. More than 1100 atomic masses have been measured meanwhile. Half-life measurements are performed with bare and few-electron ions. Decay properties of such highly-charged ions can be dramatically different from the ones known in neutral atoms. Single-particle decay spectroscopy has been developed for investigations of two-body beta decays. A brief description of the experimental methods and recent results will be presented. Future experiments at the present facility and the perspectives with the new NuSTAR/ILIMA project at FAIR will be outlined.

scholarly journals Mass spectrometry and decay spectroscopy of isomers across theZ=82shell closure

2013 ◽  
Vol 88 (5) ◽  
Author(s):  
J. Stanja ◽  
Ch. Borgmann ◽  
J. Agramunt ◽  
A. Algora ◽  
D. Beck ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Decay Spectroscopy

Developments in Penning trap (mass) spectrometry at MLLTRAP: Towards in-trap decay spectroscopy

2013 ◽  
Vol 349-350 ◽  
pp. 270-276 ◽  
Author(s):  
C. Weber ◽  
P. Müller ◽  
P.G. Thirolf
Keyword(s):  
Mass Spectrometry ◽  
Penning Trap ◽  
Decay Spectroscopy ◽  
Penning Trap Mass Spectrometry

How SIMS microscopy can be used in medicine

1992 ◽  
Vol 50 (2) ◽  
pp. 1602-1603
Author(s):  
Philippe Fragu
Keyword(s):  
Mass Spectrometry ◽  
Biomedical Applications ◽  
Secondary Ion Mass Spectrometry ◽  
Chemical Elements ◽  
Biological Applications ◽  
The Past ◽  
Potential Source ◽  
Secondary Ion ◽  
Chemical Integrity ◽  
Scientific Endeavour

The identification, localization and quantification of intracellular chemical elements is an area of scientific endeavour which has not ceased to develop over the past 30 years. Secondary Ion Mass Spectrometry (SIMS) microscopy is widely used for elemental localization problems in geochemistry, metallurgy and electronics. Although the first commercial instruments were available in 1968, biological applications have been gradual as investigators have systematically examined the potential source of artefacts inherent in the method and sought to develop strategies for the analysis of soft biological material with a lateral resolution equivalent to that of the light microscope. In 1992, the prospects offered by this technique are even more encouraging as prototypes of new ion probes appear capable of achieving the ultimate goal, namely the quantitative analysis of micron and submicron regions. The purpose of this review is to underline the requirements for biomedical applications of SIMS microscopy.Sample preparation methodology should preserve both the structural and the chemical integrity of the tissue.

Imaging of Al-Li-Cu alloys with a Scanning Ion Microprobe

1990 ◽  
Vol 48 (2) ◽  
pp. 314-315
Author(s):  
K.K. Soni ◽  
D.B. Williams ◽  
J.M. Chabala ◽  
R. Levi-Setti ◽  
D.E. Newbury
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Equilibrium Phase ◽  
Icosahedral Symmetry ◽  
Ion Microprobe ◽  
X Ray ◽  
Cu Alloys ◽  
Two Phases ◽  
The University ◽  
Secondary Ion

In contrast to the inability of x-ray microanalysis to detect Li, secondary ion mass spectrometry (SIMS) generates a very strong Li+ signal. The latter’s potential was recently exploited by Williams et al. in the study of binary Al-Li alloys. The present study of Al-Li-Cu was done using the high resolution scanning ion microprobe (SIM) at the University of Chicago (UC). The UC SIM employs a 40 keV, ∼70 nm diameter Ga+ probe extracted from a liquid Ga source, which is scanned over areas smaller than 160×160 μm2 using a 512×512 raster. During this experiment, the sample was held at 2 × 10-8 torr.In the Al-Li-Cu system, two phases of major importance are T1 and T2, with nominal compositions of Al2LiCu and Al6Li3Cu respectively. In commercial alloys, T1 develops a plate-like structure with a thickness <∼2 nm and is therefore inaccessible to conventional microanalytical techniques. T2 is the equilibrium phase with apparent icosahedral symmetry and its presence is undesirable in industrial alloys.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

New Developments in Mass Spectrometry

2014 ◽  
Keyword(s):  
Mass Spectrometry ◽  
New Developments

Mass Spectrometry

2007 ◽  
Keyword(s):  
Mass Spectrometry
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