Emission-angle dependence of fission fragment spin

The epitaxial silicon oxynitride (SiON) layer grown on a 6H-SiC(0001) surface is studied with core level photoemission spectroscopy. Si 2p spectra show three spectral components other than the bulk one. Chemical shifts and emission angle dependence of these components are well explained within a framework of a determined structure model of the SiON layer.

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DYNAMICAL SIMULATION OF EMISSION ANGLE DEPENDENCE OF FRAGMENTS SPIN IN HEAVY ION FUSION–FISSION REACTIONS

International Journal of Modern Physics E ◽

10.1142/s0218301310015850 ◽

2010 ◽

Vol 19 (07) ◽

pp. 1451-1461 ◽

Cited By ~ 3

Author(s):

M. R. PAHLAVANI ◽

D. NADERI ◽

S. M. MIRFATHI

Keyword(s):

Experimental Data ◽

Heavy Ion ◽

Emission Angle ◽

Fission Reactions ◽

Angle Dependence ◽

Dynamical Simulation ◽

Deformation Parameters ◽

Average Spin ◽

Neck Thickness ◽

Heavy Ion Fusion

In this paper, a formalism consisting of multi-dimensional Langevin equation (LE) and Scission point Transition State Model (SCTSM) have been applied to study the angle dependence of fragment's average spin for 16 O + 209 Bi and 16 O + 232 Th systems. The influence of asymmetry and deformation parameters, neck thickness of compound nucleus and pre-scission neutron multiplicity on the fragment's average spin is discussed. Results obtained using this approach are in better agreement with the experimental data as compared with the SCTSM.

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Temperature and emission angle dependence of photoluminescence from an InGaAs/GaAs quantum well in a microcavity structure

Journal of Applied Physics ◽

10.1063/1.366969 ◽

1998 ◽

Vol 83 (4) ◽

pp. 2282-2285 ◽

Cited By ~ 4

Author(s):

Dae Ho Lim ◽

Gye Mo Yang ◽

Kee Young Lim

Keyword(s):

Quantum Well ◽

Emission Angle ◽

Angle Dependence

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Preferential sputtering of isotopes: Fluence and emission-angle dependence

Physical Review Letters ◽

10.1103/physrevlett.63.2673 ◽

1989 ◽

Vol 63 (24) ◽

pp. 2673-2676 ◽

Cited By ~ 31

Author(s):

H. Gnaser ◽

H. Oechsner

Keyword(s):

Emission Angle ◽

Angle Dependence ◽

Preferential Sputtering

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TWO-DIMENSIONAL CIRCULARLY-POLARIZED-LIGHT PHOTOELECTRON DIFFRACTION FOR THE ANALYSIS OF MAGNETIC AND ELECTRONIC PROPERTIES ON SURFACES

Surface Review and Letters ◽

10.1142/s0218625x00000622 ◽

2000 ◽

Vol 07 (05n06) ◽

pp. 643-647 ◽

Cited By ~ 8

Author(s):

K. ENOMOTO ◽

Y. MIYATAKE ◽

K. FUKUMOTO ◽

A. KOBAYASHI ◽

K. HATTORI ◽

...

Keyword(s):

Electronic Properties ◽

Polarized Light ◽

Emission Angle ◽

Two Dimensional ◽

Circularly Polarized Light ◽

Circularly Polarized ◽

Photoelectron Diffraction ◽

Angle Dependence ◽

First Time ◽

Good Agreement

Circular dichroism has been measured in the photoelectron diffraction of bulk W 4f photoelectrons from the W(110)(1×1) clean surface. The forward focusing peaks along the symmetric axis in the diffraction pattern showed an azimuthal rotation similar to those reported in a prior experiment on Si(001) and chemically shifted W 4f photoelectrons from the W(110)(1×1)-O surface. The emission angle dependence of the rotation angles has been measured and analyzed for the first time and the angles observed are in good agreement with those calculated using the formula Δ ϕ=m/kR sin 2θ derived previously by Daimon et al. [Jpn. J. Phys.32, L1480 (1993)] considering the angular dependence of m. This property gives a basis for the analysis of structure or various magnetic and electronic properties on surfaces.

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