scholarly journals Trapped Electrons and Ions as Particle Detectors

2021 ◽  
Vol 127 (6) ◽  
Author(s):  
Daniel Carney ◽  
Hartmut Häffner ◽  
David C. Moore ◽  
Jacob M. Taylor
Keyword(s):  
Particle Detectors ◽  
Trapped Electrons ◽  
Electrons And Ions

In situ irradiation effects studies in medium- and high-voltage TEM

1995 ◽  
Vol 53 ◽  
pp. 234-235
Author(s):  
Charles W. Allen
Keyword(s):  
Cross Section ◽  
Particle Flux ◽  
Threshold Value ◽  
High Energy ◽  
Irradiation Damage ◽  
Defect Complexes ◽  
Lattice Position ◽  
Electrons And Ions ◽  
The Masses

With respect to structural consequences within a material, energetic electrons, above a threshold value of energy characteristic of a particular material, produce vacancy-interstial pairs (Frenkel pairs) by displacement of individual atoms, as illustrated for several materials in Table 1. Ion projectiles produce cascades of Frenkel pairs. Such displacement cascades result from high energy primary knock-on atoms which produce many secondary defects. These defects rearrange to form a variety of defect complexes on the time scale of tens of picoseconds following the primary displacement. A convenient measure of the extent of irradiation damage, both for electrons and ions, is the number of displacements per atom (dpa). 1 dpa means, on average, each atom in the irradiated region of material has been displaced once from its original lattice position. Displacement rate (dpa/s) is proportional to particle flux (cm-2s-1), the proportionality factor being the “displacement cross-section” σD (cm2). The cross-section σD depends mainly on the masses of target and projectile and on the kinetic energy of the projectile particle.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

Detector strategies for environmental scanning electron microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1296-1297
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Vacuum ◽  
Environmental Scanning Electron Microscopy ◽  
Charge Carriers ◽  
Environmental Scanning ◽  
Surface Information ◽  
X Ray ◽  
Detector Electrode ◽  
Electrons And Ions ◽  
Low Energy Electrons ◽  
Environmental Sem

Environmental SEM operate at specimen chamber pressures of ∼20 torr (2.7 kPa) allowing stabilization of liquid water at room temperature, working on rugged insulators, and generation of an environmental secondary electron (ESE) signal. All signals available in conventional high vacuum instruments are also utilized in the environmental SEM, including BSE, SE, absorbed current, CL, and X-ray. In addition, the ESEM allows utilization of the flux of charge carriers as information, providing exciting new signal modes not available to BSE imaging or to conventional high vacuum SEM.In the ESEM, at low vacuum, SE electrons are collected with a “gaseous detector”. This detector collects low energy electrons (and ions) with biased wires or plates similar to those used in early high vacuum SEM for SE detection. The detector electrode can be integrated into the first PLA or positioned at any other place resulting in a versatile system that provides a variety of surface information.

scholarly journals First transmission of electrons and ions through the KATRIN beamline

2018 ◽  
Vol 13 (04) ◽  
pp. P04020-P04020 ◽  
Author(s):  
M. Arenz ◽  
W.-J. Baek ◽  
M. Beck ◽  
A. Beglarian ◽  
J. Behrens ◽  
...  
Keyword(s):  
Electrons And Ions

scholarly journals A path integral formulation for particle detectors: the Unruh-DeWitt model as a line defect

2021 ◽  
Vol 2021 (3) ◽  
Author(s):  
Ivan M. Burbano ◽  
T. Rick Perche ◽  
Bruno de S. L. Torres
Keyword(s):  
Path Integral ◽  
Degrees Of Freedom ◽  
Wilson Line ◽  
Transition Probability ◽  
Relativistic Quantum ◽  
Quantum Fields ◽  
Line Defect ◽  
Particle Detectors ◽  
Nonlocal Operators ◽  
Detector Model

Abstract Particle detectors are an ubiquitous tool for probing quantum fields in the context of relativistic quantum information (RQI). We formulate the Unruh-DeWitt (UDW) particle detector model in terms of the path integral formalism. The formulation is able to recover the results of the model in general globally hyperbolic spacetimes and for arbitrary detector trajectories. Integrating out the detector’s degrees of freedom yields a line defect that allows one to express the transition probability in terms of Feynman diagrams. Inspired by the light-matter interaction, we propose a gauge invariant detector model whose associated line defect is related to the derivative of a Wilson line. This is another instance where nonlocal operators in gauge theories can be interpreted as physical probes for quantum fields.

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