scholarly journals First transmission of electrons and ions through the KATRIN beamline

2018 ◽  
Vol 13 (04) ◽  
pp. P04020-P04020 ◽  
Author(s):  
M. Arenz ◽  
W.-J. Baek ◽  
M. Beck ◽  
A. Beglarian ◽  
J. Behrens ◽  
...  
Keyword(s):  
Electrons And Ions

In situ irradiation effects studies in medium- and high-voltage TEM

1995 ◽  
Vol 53 ◽  
pp. 234-235
Author(s):  
Charles W. Allen
Keyword(s):  
Cross Section ◽  
Particle Flux ◽  
Threshold Value ◽  
High Energy ◽  
Irradiation Damage ◽  
Defect Complexes ◽  
Lattice Position ◽  
Electrons And Ions ◽  
The Masses

With respect to structural consequences within a material, energetic electrons, above a threshold value of energy characteristic of a particular material, produce vacancy-interstial pairs (Frenkel pairs) by displacement of individual atoms, as illustrated for several materials in Table 1. Ion projectiles produce cascades of Frenkel pairs. Such displacement cascades result from high energy primary knock-on atoms which produce many secondary defects. These defects rearrange to form a variety of defect complexes on the time scale of tens of picoseconds following the primary displacement. A convenient measure of the extent of irradiation damage, both for electrons and ions, is the number of displacements per atom (dpa). 1 dpa means, on average, each atom in the irradiated region of material has been displaced once from its original lattice position. Displacement rate (dpa/s) is proportional to particle flux (cm-2s-1), the proportionality factor being the “displacement cross-section” σD (cm2). The cross-section σD depends mainly on the masses of target and projectile and on the kinetic energy of the projectile particle.

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

Detector strategies for environmental scanning electron microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1296-1297
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Vacuum ◽  
Environmental Scanning Electron Microscopy ◽  
Charge Carriers ◽  
Environmental Scanning ◽  
Surface Information ◽  
X Ray ◽  
Detector Electrode ◽  
Electrons And Ions ◽  
Low Energy Electrons ◽  
Environmental Sem

Environmental SEM operate at specimen chamber pressures of ∼20 torr (2.7 kPa) allowing stabilization of liquid water at room temperature, working on rugged insulators, and generation of an environmental secondary electron (ESE) signal. All signals available in conventional high vacuum instruments are also utilized in the environmental SEM, including BSE, SE, absorbed current, CL, and X-ray. In addition, the ESEM allows utilization of the flux of charge carriers as information, providing exciting new signal modes not available to BSE imaging or to conventional high vacuum SEM.In the ESEM, at low vacuum, SE electrons are collected with a “gaseous detector”. This detector collects low energy electrons (and ions) with biased wires or plates similar to those used in early high vacuum SEM for SE detection. The detector electrode can be integrated into the first PLA or positioned at any other place resulting in a versatile system that provides a variety of surface information.

scholarly journals Charged particle guiding and beam splitting with auto-ponderomotive potentials on a chip

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Robert Zimmermann ◽  
Michael Seidling ◽  
Peter Hommelhoff
Keyword(s):  
Charged Particle ◽  
Large Range ◽  
Proof Of Concept ◽  
Beam Splitting ◽  
Particle Beams ◽  
Effective Potentials ◽  
Charged Particle Beams ◽  
Electrons And Ions ◽  
Ponderomotive Forces ◽  
Planar Substrates

AbstractElectron and ion beams are indispensable tools in numerous fields of science and technology, ranging from radiation therapy to microscopy and lithography. Advanced beam control facilitates new functionalities. Here, we report the guiding and splitting of charged particle beams using ponderomotive forces created by the motion of charged particles through electrostatic optics printed on planar substrates. Shape and strength of the potential can be locally tailored by the lithographically produced electrodes’ layout and the applied voltages, enabling the control of charged particle beams within precisely engineered effective potentials. We demonstrate guiding of electrons and ions for a large range of energies (from 20 to 5000 eV) and masses (from 5 · 10−4 to 131 atomic mass units) as well as electron beam splitting for energies up to the keV regime as a proof-of-concept for more complex beam manipulation.

Intercomponent Momentum Transport and Electrical Conductivity of Collisionless Plasma

1973 ◽  
Vol 51 (24) ◽  
pp. 2604-2611 ◽  
Author(s):  
H. E. Wilhelm
Keyword(s):  
Electrical Conductivity ◽  
Electric Field ◽  
Collisionless Plasma ◽  
Electrical Current ◽  
Distribution Functions ◽  
Momentum Transport ◽  
Ion Drift ◽  
Moment Approximation ◽  
Electrons And Ions ◽  
Two Component

Based on the Lenard–Balescu equation, the interaction integral for the intercomponent momentum transfer in a two-component, collisionless plasma is evaluated in closed form. The distribution functions of the electrons and ions are represented in the form of nonisothermal, displaced Max wellians corresponding to the 5-moment approximation. As an application, the transport of electrical current in an electric field is discussed for infrasonic up to sonic electron–ion drift velocities.

Electrons and Ions in Relativistic Laser Fields

2001 ◽  
pp. 273-283
Author(s):  
Y. I. Salamin ◽  
M. W. Walser ◽  
S. X. Hu ◽  
C. H. Keitel
Keyword(s):  
Laser Fields ◽  
Electrons And Ions
Sign in / Sign up

Export Citation Format

Share Document