Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy ofTiO2(110)−(1×1)and -(1×2): Simultaneous Imaging of Surface Structures and Electronic States

2001 ◽  
Vol 86 (19) ◽  
pp. 4334-4337 ◽  
Author(s):  
M. Ashino ◽  
Y. Sugawara ◽  
S. Morita ◽  
M. Ishikawa
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Electronic States ◽  
Surface Structures ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Simultaneous Imaging ◽  
Atomic Force

scholarly journals Atomic Resolution with the Atomic Force Microscope

1995 ◽  
Vol 3 (4) ◽  
pp. 6-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Atomic Force Microscope ◽  
Recent Article ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force

For biologic studies, atomic force microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM) because it has the capability of imaging non-conducting biologic specimens. However, STM generally gives better resolution than AFM, and we're talking about resolution on the atomic scale. In a recent article, Franz Giessibl (Atomic resolution of the silicon (111)- (7X7) surface by atomic force microscopy, Science 267:68-71, 1995) has demonstrated that atoms can be imaged by AFM.

Nanometer-sized tungsten tips for STM and AFM

1991 ◽  
Vol 49 ◽  
pp. 386-387
Author(s):  
Mircea Fotino
Keyword(s):  
Surface Structures ◽  
Three Dimensions ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Mechanical Grinding ◽  
Tunneling Microscopy ◽  
Essential Requirement ◽  
Force Microscopy ◽  
Atomic Force

An essential requirement in the pursuit of atomic resolution by scanning tunneling microscopy (STM) or atomic force microscopy (AFM) is the use of a tip with an apex of dimensions comparable to or preferably smaller than those of the specimen to be identified. Although atomic resolution of mostly planar specimens has been obtained even with atomically blunt tips, the above requirement appears indispensable for determining 3D surface structures extending equally in all three dimensions.Tips most commonly used so far in STM or AFM applications are made by grinding or by etching a thin and rigid Pt/Ir or W wire. Mechanical grinding occasionally leaves protruding spikes typically several tens of nm in radius that can play the role of scanning stilus even though neither adequately oriented nor particularly sharp and symmetric.

Quantitative Scanning Tunneling Microscopy at Atomic Resolution: Influence of Forces and Tip Configuration

1996 ◽  
Vol 76 (8) ◽  
pp. 1276-1279 ◽  
Author(s):  
A. R. H. Clarke ◽  
J. B. Pethica ◽  
J. A. Nieminen ◽  
F. Besenbacher ◽  
E. Lægsgaard ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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