Correlation of Stress and Atomic-Scale Surface Roughness Evolution during Intermittent Homoepitaxial Growth of (111)-Oriented Ag and Cu

2004 ◽  
Vol 93 (5) ◽  
Author(s):  
C. Friesen ◽  
C. V. Thompson
Keyword(s):  
Surface Roughness ◽  
Atomic Scale ◽  
Homoepitaxial Growth ◽  
Scale Surface ◽  
Surface Roughness Evolution

Effect of atomic-scale surface roughness on friction: A molecular dynamics study of diamond surfaces

Wear ◽  
1993 ◽  
Vol 168 (1-2) ◽  
pp. 127-133 ◽  
Author(s):  
Judith A. Harrison ◽  
Richard J. Colton ◽  
Carter T. White ◽  
Donald W. Brenner
Keyword(s):  
Molecular Dynamics ◽  
Surface Roughness ◽  
Atomic Scale ◽  
Diamond Surfaces ◽  
Scale Surface

Effect of Atomic-Scale Roughness on Contact Behavior

2011 ◽  
Vol 86 ◽  
pp. 584-589
Author(s):  
Fang Li Duan ◽  
He Bing Qiu ◽  
Ji Ming Yang ◽  
Cong Ying Wu
Keyword(s):  
Surface Roughness ◽  
Large Scale ◽  
Atomic Scale ◽  
Real Contact Area ◽  
Hertz Model ◽  
Contact Behavior ◽  
Flat Substrate ◽  
Dynamics Simulations ◽  
Scale Roughness ◽  
Scale Surface

Large-scale molecular dynamics simulations are performed to study the effect of atomic-scale surface roughness on nano-contact. The modeling system consists of rigid spherical tips with different surface roughness and elastic flat substrate. Our results show that atomic-scale multi-asperity can change the contact behavior from consistent with the Hertz model to the Persson model. However, adhesion will reduce the influence of surface roughness, to the extent that the two tips with different roughness show similar variations of real contact area with applied load. The maximum compression and tensile stress of the rough tip is about 2 times and 1.5 times that of the smooth one, respectively. Moreover, the rough tip exhibits larger repulsive force and attractive force in the entire range of simulated load. Our simulations suggest that pull-off force cannot characterize the extent of the influence of adhesion on contact behavior at the nanoscale.

Surface Morphology of Ultrathin Oxide Formed on Si(100)

1999 ◽  
Vol 567 ◽  
Author(s):  
T. Hattori ◽  
M. Fujimura ◽  
H. Nohira
Keyword(s):  
Surface Roughness ◽  
Oxide Film ◽  
Film Thickness ◽  
Atomic Scale ◽  
Oxide Surface ◽  
Atomic Step ◽  
Oxide Film Thickness ◽  
Induced Stress ◽  
Ultrathin Oxide ◽  
Scale Surface

ABSTRACTThe atomic-scale surface roughness of ultrathin thermal oxides formed on Si(100) were studied as a function of oxide film thickness up to the thickness of 2.0 nm. The height deviation on oxide surface is limited within single atomic-step height of 0.135 nm on Si(100) surface below the oxide film thickness of about 1 nm, but above this thickness the height deviation increases with the increase in thickness at 700°C. This increase in height deviation with thickness must be produced by the relaxation of oxidation–induced stress in bulk SiO2. Furthermore, the oscillation in surface roughness with constant amplitude and its oscillating period in oxide film thickness of 0.19 nm were found.

Atomic-Scale Surface Roughness of Rutile and Implications for Organic Molecule Adsorption

Langmuir ◽  
2013 ◽  
Vol 29 (23) ◽  
pp. 6876-6883 ◽  
Author(s):  
Kenneth J. T. Livi ◽  
Bernhard Schaffer ◽  
David Azzolini ◽  
Che R. Seabourne ◽  
Trevor P. Hardcastle ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Organic Molecule ◽  
Atomic Scale ◽  
Molecule Adsorption ◽  
Scale Surface

Simulation of atomic-scale surface migration in homoepitaxial growth using embedded-atom method potentials for gold

1998 ◽  
Vol 318 (1-2) ◽  
pp. 52-56 ◽  
Author(s):  
Jun-ichiro Takano ◽  
Osamu Takai ◽  
Yoshiaki Kogure ◽  
Masao Doyama
Keyword(s):  
Atomic Scale ◽  
Embedded Atom Method ◽  
Homoepitaxial Growth ◽  
Embedded Atom ◽  
Surface Migration ◽  
Scale Surface

scholarly journals Fabrication and Characterization of Polystyrene Surface with Atomic-Scale Surface Roughness

2012 ◽  
Vol 10 (0) ◽  
pp. 591-593
Author(s):  
Katsumi Shimizu ◽  
Syoushi Higuchi ◽  
Amane Kitahara ◽  
Hikaru Terauchi ◽  
Isao Takahashi
Keyword(s):  
Surface Roughness ◽  
Atomic Scale ◽  
Polystyrene Surface ◽  
Fabrication And Characterization ◽  
Scale Surface

Atomic-scale surface science phenomena studied by scanning tunneling microscopy

2009 ◽  
Vol 603 (10-12) ◽  
pp. 1315-1327 ◽  
Author(s):  
F. Besenbacher ◽  
J.V. Lauritsen ◽  
T.R. Linderoth ◽  
E. Lægsgaard ◽  
R.T. Vang ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Surface Science ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Scale Surface
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