scholarly journals Improvement of Fresnel zone plate beam-profile monitor and application to ultralow emittance beam profile measurements

Author(s):  
Hiroshi Sakai ◽  
Masami Fujisawa ◽  
Kensuke Iida ◽  
Isao Ito ◽  
Hirofumi Kudo ◽  
...  
2007 ◽  
Author(s):  
Masami Fujisawa ◽  
Hiroshi Sakai ◽  
Norio Nakamura ◽  
Hitoshi Hayano ◽  
Toshiya Muto

2010 ◽  
Vol 2010 ◽  
pp. 1-6 ◽  
Author(s):  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Hisataka Takenaka ◽  
Ikuo Okada

A Fresnel zone plate (FZP) with 35 nm outermost zone width has been fabricated and tested in the hard X-ray region. The FZP was made by electron beam lithography and reactive ion etching technique. The performance test of the FZP was carried out by measuring the focused beam profile for coherent hard X-ray beam at the beamline 20XU of SPring-8. The full width at half maximum of the focused beam profile measured by knife-edge scan method is 34.9±2.7 nm, that agrees well with the theoretical value of diffraction-limited resolution. Applications to scanning microscopy were also carried out.


Author(s):  
Daniel Jandura ◽  
Dusan Pudis ◽  
Tomas Mizera ◽  
Marek Vevericik ◽  
Peter Gaso

2021 ◽  
Vol 92 (2) ◽  
pp. 023701 ◽  
Author(s):  
Akihisa Takeuchi ◽  
Kentaro Uesugi ◽  
Masayuki Uesugi ◽  
Hiroyuki Toda ◽  
Kyosuke Hirayama ◽  
...  

1994 ◽  
Vol 109 (3-4) ◽  
pp. 324-327 ◽  
Author(s):  
Yu.A. Basov ◽  
D.V. Roshchupkin ◽  
A.E. Yakshin

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