Effects of Bragg peak profiles and nanoparticle sizes on the real-space pair distribution function

2005 ◽  
Vol 38 (1) ◽  
pp. 55-61 ◽  
Author(s):  
Il-Kyoung Jeong ◽  
M. J. Graf ◽  
R. H. Heffner

A study of the effects of Bragg peak profiles and nanoparticle size broadening on the real-space pair distribution function (PDF) is presented, using `synthetic' powder diffraction data. Bragg peak profiles from both asymmetric time-of-flight (TOF) spallation neutron data and symmetric synchrotron X-ray data are considered. Due to their asymmetric peak profiles, the TOF data cause artificial shifts of the PDF peak positions towards higher pair distances. Coupled with this effect is a broadening of the PDF peak widths due to aQ-dependent spectrometer resolution, making reliable refinement of thermal parameters difficult. These effects become more pronounced as theQresolution becomes worse. By contrast, the symmetric X-ray powder diffraction data do not cause a systematic shift of the PDF peak positions, and the broadening of the PDF peak widths has a relatively minor effect on the extraction of the thermal parameters. Finally, nanoparticle size broadening of the asymmetric neutron TOF powder diffraction data causes a shift of the PDF peak positions towards lowerrvalues and smears the PDF intensities from one atomic shell to another.

2019 ◽  
Vol 52 (5) ◽  
pp. 1072-1076 ◽  
Author(s):  
Frederick Marlton ◽  
Oleh Ivashko ◽  
Martin v. Zimmerman ◽  
Olof Gutowski ◽  
Ann-Christin Dippel ◽  
...  

Total scattering and pair distribution function (PDF) analysis has created new insights that traditional powder diffraction methods have been unable to achieve in understanding the local structures of materials exhibiting disorder or complex nanostructures. Care must be taken in such analyses as subtle and discrete features in the PDF can easily be artefacts generated in the measurement process, which can result in unphysical models and interpretation. The focus of this study is an artefact called the parallax effect, which can occur in area detectors with thick detection layers during the collection of X-ray PDF data. This effect results in high-Q peak offsets, which subsequently cause an r-dependent shift in the PDF peak positions in real space. Such effects should be accounted for if a truly accurate model is to be achieved, and a simple correction that can be conducted via a Rietveld refinement against the reference data is proposed.


2020 ◽  
Author(s):  
Anuradha Pallipurath ◽  
Francesco Civati ◽  
Jonathan Skelton ◽  
Dean Keeble ◽  
Clare Crowley ◽  
...  

X-ray pair distribution function analysis is used with first-principles molecular dynamics simulations to study the co-operative H<sub>2</sub>O binding, structural dynamics and host-guest interactions in the channel hydrate of diflunisal.


2013 ◽  
Vol 28 (S2) ◽  
pp. S481-S490
Author(s):  
Oriol Vallcorba ◽  
Anna Crespi ◽  
Jordi Rius ◽  
Carles Miravitlles

The viability of the direct-space strategy TALP (Vallcorba et al., 2012b) to solve crystal structures of molecular compounds from laboratory powder diffraction data is shown. The procedure exploits the accurate metric refined from a ‘Bragg-Brentano’ powder pattern to extract later the intensity data from a second ‘texture-free’ powder pattern with the DAJUST software (Vallcorba et al., 2012a). The experimental setup for collecting this second pattern consists of a circularly collimated X-ray beam and a 2D detector. The sample is placed between two thin Mylar® foils, which reduces or even eliminates preferred orientation. With the combination of the DAJUST and TALP software a preliminary but rigorous structural study of organic compounds can be carried out at the laboratory level. In addition, the time-consuming filling of capillaries with diameters thinner than 0.3mm is avoided.


2003 ◽  
Vol 12 (3) ◽  
pp. 310-314
Author(s):  
Chen Jian-Rong ◽  
Gu Yuan-Xin ◽  
Fan Hai-Fu

2010 ◽  
Vol 25 (3) ◽  
pp. 247-252 ◽  
Author(s):  
F. Laufek ◽  
J. Návrátil

The crystal structure of skutterudite-related phase IrGe1.5Se1.5 has been refined by the Rietveld method from laboratory X-ray powder diffraction data. Refined crystallographic data for IrGe1.5Se1.5 are a=12.0890(2) Å, c=14.8796(3) Å, V=1883.23(6) Å3, space group R3 (No. 148), Z=24, and Dc=8.87 g/cm3. Its crystal structure can be derived from the ideal skutterudite structure (CoAs3), where Se and Ge atoms are ordered in layers perpendicular to the [111] direction of the original skutterudite cell. Weak distortions of the anion and cation sublattices were also observed.


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