Incommensurate modulated disorder in Ba0.85Ca2.15In6O12

1996 ◽  
Vol 52 (5) ◽  
pp. 780-789 ◽  
Author(s):  
G. Baldinozzi ◽  
F. Goutenoire ◽  
M. Hervieu ◽  
E. Suard ◽  
D. Grebille
Keyword(s):  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
X Ray ◽  
Incommensurate Structure ◽  
Resolution Electron ◽  
Complete Determination ◽  
Incommensurate Modulation ◽  
Diffraction Patterns

The tunnel structure of the oxide Ba0.85Ca2.15In6O12 has been revisited. A mono-incommensurate modulation has been evidenced by electron diffraction. The simultaneous refinement of X-ray and neutron powder diffraction patterns has allowed a complete determination of the incommensurate structure [P3({{1}\over{3}} {{1}\over{3}}γ)]. The existence of a modulated disorder, affecting Ba and Ca atoms, has been pointed out. The occupancy modulation concerning Ba and Ca atoms located on the hexagonal tunnel axis induces a modulation of the Ba—O bond lengths. The high-resolution electron microscopy study has shown the existence of twinning domains and of crystal regions possessing a defective arrangement of the modulation.

High‐resolution electron microscopy study of x‐ray multilayer structures

1987 ◽  
Vol 61 (4) ◽  
pp. 1422-1428 ◽  
Author(s):  
Amanda K. Petford‐Long ◽  
Mary Beth Stearns ◽  
C.‐H. Chang ◽  
S. R. Nutt ◽  
D. G. Stearns ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Multilayer Structures ◽  
X Ray ◽  
Resolution Electron

High-resolution electron microscopy study of a Si-Mo x-ray mirror

1987 ◽  
Vol 45 ◽  
pp. 400-401
Author(s):  
R. Gronsky ◽  
J. Punglia
Keyword(s):  
Materials Science ◽  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Thin Layers ◽  
Light Sources ◽  
X Rays ◽  
Optical Elements ◽  
X Ray ◽  
Resolution Electron

The science of x-ray optics has undergone rapid growth in recent years, spurned by the availability of high intensity light sources with tunable optical characteristics in the XUV spectral region which includes soft x-rays and ultraviolet radiation. The development of optical elements for use with XUV radiation has followed a parallel path of development with most recent emphasis being placed upon multilayer coatings that enhance the reflectivity of x-ray mirrors and at the same time provide spectral selectivity. In their simplest form, these coatings consist of alternating thin layers of two materials with different refractive indices that yield both the desired high reflectivity and a relatively broad wavelength bandpass. Additional considerations are based on their materials science: the multilayers must have atomically smooth interfaces and be resistant to interdiffusion or chemical reaction. A summary of their preparation and utilization is given in reference 3.

Structure determination of inorganic structures by HREM, Cip, and electron diffraction

1993 ◽  
Vol 51 ◽  
pp. 1204-1205
Author(s):  
Xiaodong Zou ◽  
V.G. Zubkov ◽  
Gunnar Svensson ◽  
Sven Hovmöller
Keyword(s):  
Image Processing ◽  
Electron Diffraction ◽  
Ccd Camera ◽  
High Resolution Electron Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resolution Electron ◽  
Diffraction Patterns ◽  
The Fourier Transform

High resolution electron microscopy (HREM) combined with crystallographic image processing (CIP) is becoming a powerful technique for solving inorganic structures. With the image processing systems CRISP and ELD, running on a personal computer, this technique can be easily established in other laboratories. HREM images and electron diffraction patterns are digitized by a CCD camera and transferred into a PC. Phases and amplitudes are extracted from the Fourier transform of the HREM images. For thin crystals of metal oxides, the phases obtained by HREM and CIP inside the Scherzer resolution of the microscope are identical to the x-ray structure factor phases.Electron diffraction extends to much higher resolution than EM images (beyond 1 Å). The quality of the amplitudes is also higher than that from images, since ED data is not affected by the contract transfer function (CTF). Amplitudes extracted by ELD are close to x-ray diffraction amplitudes (within 30%).

Stacking disorder in silicon carbide supported cobalt crystallites: an X-ray diffraction, electron diffraction and high resolution electron microscopy study

2016 ◽  
Vol 18 (43) ◽  
pp. 30183-30188 ◽  
Author(s):  
H. E. du Plessis ◽  
J. P. R. de Villiers ◽  
A. Tuling ◽  
E. J. Olivier
Keyword(s):  
Electron Microscopy ◽  
Supported Catalyst ◽  
High Resolution Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
X Ray Diffraction ◽  
Fischer Tropsch ◽  
X Ray ◽  
Resolution Electron ◽  
Stacking Disorder

Supported cobalt Fischer–Tropsch catalysts are characteristically nanoparticulate and the reduced SiC supported catalyst was found to contain both HCP and FCC polymorphs.

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