Analytical evaluation of thermal diffuse scattering contributions to integrated X-ray intensities in the vicinity of a Bragg reflection

1969 ◽  
Vol 25 (2) ◽  
pp. 319-329 ◽  
Author(s):  
E. F. Skelton ◽  
J. L. Katz
Keyword(s):  
Diffuse Scattering ◽  
Bragg Reflection ◽  
Analytical Evaluation ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Thermal Diffuse

Diffraction Pattern Caused by X-Ray Thermal Diffuse Scattering in Absorbing Perfect Crystal

1988 ◽  
Vol 57 (2) ◽  
pp. 524-534 ◽  
Author(s):  
Yasuji Kashiwase ◽  
Masahiro Mori ◽  
Motokazu Kogiso ◽  
Masayuki Minoura ◽  
Satoshi Sasaki
Keyword(s):  
Diffraction Pattern ◽  
Diffuse Scattering ◽  
Perfect Crystal ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Thermal Diffuse

Practical Aspects of Removing the Effects of Elastic and Thermal Diffuse Scattering from Spectroscopic Data for Single Crystals

2014 ◽  
Vol 20 (4) ◽  
pp. 1078-1089 ◽  
Author(s):  
Nathan R. Lugg ◽  
Melissa J. Neish ◽  
Scott D. Findlay ◽  
Leslie J. Allen
Keyword(s):  
Factor Analysis ◽  
Energy Loss ◽  
Single Crystals ◽  
Electron Energy ◽  
Diffuse Scattering ◽  
Energy Dispersive ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Electron Energy Loss ◽  
Thermal Diffuse

AbstractA method to remove the effects of elastic and thermal diffuse scattering (TDS) of the incident electron probe from electron energy-loss and energy-dispersive X-ray spectroscopy data for atomically resolved spectrum images of single crystals of known thickness is presented. By calculating the distribution of the probe within a specimen of known structure, it is possible to deconvolve the channeling of the probe and TDS from experimental data by reformulating the inelastic cross-section as an inverse problem. In electron energy-loss spectroscopy this allows valid comparisons with first principles fine-structure calculations to be made. In energy-dispersive X-ray spectroscopy, direct compositional analyses such as ζ-factor and Cliff–Lorimer k-factor analysis can be performed without the complications of channeling and TDS. We explore in detail how this method can be incorporated into existing multislice programs, and demonstrate practical considerations in implementing this method using a simulated test specimen. We show the importance of taking into account the scattering of the probe in k-factor analysis in a zone axis orientation. The applicability and limitations of the method are discussed.

X-Ray Attenuation in Silicon and Germanium in the Energy Range 25 to 50 keV

1977 ◽  
Vol 32 (6) ◽  
pp. 588-593 ◽  
Author(s):  
L. Gerward ◽  
G. Thuesen
Keyword(s):  
Energy Range ◽  
Single Crystals ◽  
Diffuse Scattering ◽  
Theoretical Calculations ◽  
Photoelectric Absorption ◽  
Attenuation Coefficients ◽  
Thermal Diffuse Scattering ◽  
X Ray ◽  
Silicon And Germanium ◽  
Thermal Diffuse

Abstract The X-ray attenuation coefficients of silicon and germanium single crystals have been measured using an energy-dispersive method with particular emphasis on the energy range 25 to 50 keV. The experimental results are compared with theoretical calculations of the photoelectric absorption as well as the attenuation due to the Compton scattering and thermal diffuse scattering.

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