scholarly journals MOMAC: a SAXS/WAXS laboratory instrument dedicated to nanomaterials

2016 ◽  
Vol 49 (5) ◽  
pp. 1624-1631 ◽  
Author(s):  
Olivier Taché ◽  
Stéphan Rouzière ◽  
Philippe Joly ◽  
Mohamed Amara ◽  
Blaise Fleury ◽  
...  

This article presents the technical characteristics of a newly built small- and wide-angle X-ray scattering (SAXS/WAXS) apparatus dedicated to structural characterization of a wide range of nanomaterials in the powder or dispersion form. The instrument is based on a high-flux rotating anode generator with a molybdenum target, enabling the assessment of highly absorbing samples containing heavy elements. The SAXS part is composed of a collimation system including a multilayer optic and scatterless slits, a motorized sample holder, a vacuum chamber, and a two-dimensional image-plate detector. All the control command is done through a TANGO interface. Normalization and data correction yield scattering patterns at the absolute scale automatically with a q range from 0.03 to 3.2 Å−1. The WAXS part features a multilayer collimating optic and a two-dimensional image-plate detector with variable sample-to-detector distances. The accessible q range is 0.4–9 Å−1, ensuring a large overlap in q range between the two instruments. A few examples of applications are also presented, namely coupled SAXS/WAXS structure and symmetry determination of gold nanocrystals in solution and characterization of imogolite nanotubes and iron-filled carbon nanotube samples.

Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 929
Author(s):  
Xudong Yang ◽  
Zexiao Li ◽  
Linlin Zhu ◽  
Yuchu Dong ◽  
Lei Liu ◽  
...  

Taper-cutting experiments are important means of exploring the nano-cutting mechanisms of hard and brittle materials. Under current cutting conditions, the brittle-ductile transition depth (BDTD) of a material can be obtained through a taper-cutting experiment. However, taper-cutting experiments mostly rely on ultra-precision machining tools, which have a low efficiency and high cost, and it is thus difficult to realize in situ measurements. For taper-cut surfaces, three-dimensional microscopy and two-dimensional image calculation methods are generally used to obtain the BDTDs of materials, which have a great degree of subjectivity, leading to low accuracy. In this paper, an integrated system-processing platform is designed and established in order to realize the processing, measurement, and evaluation of taper-cutting experiments on hard and brittle materials. A spectral confocal sensor is introduced to assist in the assembly and adjustment of the workpiece. This system can directly perform taper-cutting experiments rather than using ultra-precision machining tools, and a small white light interference sensor is integrated for in situ measurement of the three-dimensional topography of the cutting surface. A method for the calculation of BDTD is proposed in order to accurately obtain the BDTDs of materials based on three-dimensional data that are supplemented by two-dimensional images. The results show that the cutting effects of the integrated platform on taper cutting have a strong agreement with the effects of ultra-precision machining tools, thus proving the stability and reliability of the integrated platform. The two-dimensional image measurement results show that the proposed measurement method is accurate and feasible. Finally, microstructure arrays were fabricated on the integrated platform as a typical case of a high-precision application.


2013 ◽  
Vol 21 (3) ◽  
pp. 552-562
Author(s):  
Hsuan-Chun Liao ◽  
Mochamad Asri ◽  
Tsuyoshi Isshiki ◽  
Dongju Li ◽  
Hiroaki Kunieda

1988 ◽  
Vol 121 ◽  
Author(s):  
Lawrence W. Hrubesh ◽  
Cynthia T. Alviso

ABSTRACTTwo optical methods are described for mapping the local variations of refractive index within monoliths of porous silica aerogel. One is an interferometrie measurement that produces “iso-index” fringes in a two dimensional image; an orthogonal view gives the third dimension information. The other method uses the deflection of a He-Ne laser beam to map the gradient index within a sample. The quantification of the measurements is described and the accuracy of the results is discussed.


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