Theoretical consideration of an X-ray Bragg-reflection lens using the eikonal approximation

2014 ◽  
Vol 21 (4) ◽  
pp. 700-707
Author(s):  
Minas K. Balyan
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron ◽  
Theoretical Consideration ◽  
Bragg Reflection ◽  
Eikonal Approximation ◽  
Perfect Crystal ◽  
Free Electron Lasers ◽  
X Ray ◽  
Radiation Sources ◽  
Focus Spot

On the basis of the eikonal approximation, X-ray Bragg-case focusing by a perfect crystal with parabolic-shaped entrance surface is considered theoretically. Expressions for focal distances, intensity gain and distribution around the focus spot as well as for the focus spot sizes are obtained. The condition of point focusing is presented. The experiment can be performed using X-ray synchrotron radiation sources (particularly free-electron lasers).

FREE-ELECTRON LASER SPECTROSCOPY OF SURFACES AND INTERFACES

1995 ◽  
Vol 02 (04) ◽  
pp. 501-512 ◽  
Author(s):  
N.H. TOLK ◽  
J.T. MCKINLEY ◽  
G. MARGARITONDO
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron ◽  
Free Electron Laser ◽  
Interface Energy ◽  
Free Electron Lasers ◽  
Semiconductor Interface ◽  
X Ray ◽  
Surface And Interface ◽  
Surfaces And Interfaces ◽  
Radiation Sources

Synchrotron-radiation sources have become, since the late 1960’s, one of the fundamental experimental tools for surface and interface research. Only recently, however, a related type of photon sources - the free-electron lasers (FELs) — has begun to make important contributions to this field. For example, FELs have been used to reach unprecedented levels of accuracy and reliability in measuring semiconductor interface energy barriers. We review some of the present and proposed experiments that are made possible by the unmatched brightness and broad tunability of infrared FELs. Practical examples discussed in the review are supplied by our own programs at the Vanderbilt Free-Electron Laser. We also briefly analyze the possible future development of FELs and of their applications to surface and interface research, in particular, the possibility of x-ray FELs.

Accelerator-based X-ray sources: synchrotron radiation, X-ray free electron lasers and beyond

2019 ◽  
Vol 377 (2147) ◽  
pp. 20180231 ◽  
Author(s):  
Tetsuya Ishikawa
Keyword(s):  
Synchrotron Radiation ◽  
Storage Ring ◽  
Free Electron ◽  
Continuous Wave ◽  
Transitional Period ◽  
Light Sources ◽  
X Rays ◽  
Free Electron Lasers ◽  
Beam Emittance ◽  
X Ray

The evolution of synchrotron radiation (SR) sources and related sciences is discussed to explain the ‘generation’ of the SR sources. Most of the contemporary SR sources belong to the third generation, where the storage rings are optimized for the use of undulator radiation. The undulator development allowed to reduction of the electron energy of the storage ring necessary for delivering 10 keV X-rays from the initial 6–8 GeV to the current 3 Gev. Now is the transitional period from the double-bend-achromat lattice-based storage ring to the multi-bend-achromat lattice to achieve much smaller electron beam emittance. Free electron lasers are the other important accelerator-based light sources which recently reached hard X-ray regime by using self-amplified spontaneous emission scheme. Future accelerator-based X-ray sources should be continuous wave X-ray free electron lasers and pulsed X-ray free electron lasers. Some pathways to reach the future case are discussed. This article is part of the theme issue ‘Fifty years of synchrotron science: achievements and opportunities’.

scholarly journals An introduction to the special issue onX-ray free-electron lasers

2015 ◽  
Vol 22 (3) ◽  
pp. 471-471 ◽  
Author(s):  
Ilme Schlichting ◽  
William E. White ◽  
Makina Yabashi
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron ◽  
Free Electron Lasers ◽  
Special Issue ◽  
X Ray

This issue of theJournal of Synchrotron Radiationis a special issue on X-ray free-electron lasers. Here, a brief introduction to these special issue papers is given.

Mechanical aspects of the ID26 emission spectrometer II: improving stability for a large instrument by the use of multiple air pad supports

2010 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
L. Ducotté ◽  
P. Glatzel ◽  
P. Marion ◽  
C. Lapras ◽  
M. Lesourd ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Vertical Plane ◽  
Vertical Axis ◽  
High Energy ◽  
Perfect Crystal ◽  
European Synchrotron Radiation Facility ◽  
High Energy Resolution ◽  
X Ray ◽  
Radiation Sources ◽  
Almost All

An instrument for X-ray emission spectroscopy (XES) based on perfect crystal Bragg optics was recently commissioned at beam line ID26 of the ESRF (European Synchrotron Radiation Facility). The spectrometer is used to record high-energy resolution fluorescence-detected X-ray absorption spectra with sub-lifetime resolution and to perform resonant and non-resonant XES. The hard X-ray probe is material bulk sensitive and allows demanding sample environments (in situ chemistry, high pressure, etc.). Spectrometers for XES are being installed or designed at almost all upcoming synchrotron radiation sources worldwide. The particularity of the ID26 spectrometer is to accommodate five analyser crystals with exact Rowland tracking in the vertical plane and with crystals radii between 0.5 and 2 m.The main upgrade of the new version of this large instrument (3 tonnes, overall size 2.5 m and height 3 m) is to allow the change of the scattering angle over the range 0–180°. This involves rotating the entire spectrometer around a vertical axis that passes through the sample. In order to optimize the vibration stability of the spectrometer's structure, we chose to support the structure in multiple points and not only on three (kinematic mount) like it is specified to do with air pads. According to this choice, we have developed special foot holders for air pads.The calculations during the design phase have shown that we can obtain a first modal frequency of the spectrometer's structure at more than 30 Hz. To confirm our predictive calculations, we have performed some vibration measurements.

6. Sources of radiation

2016 ◽  
pp. 107-128
Author(s):  
A. M. Glazer
Keyword(s):  
Synchrotron Radiation ◽  
Electron Diffraction ◽  
Visible Light ◽  
Free Electron ◽  
Horizontal Plane ◽  
Vertical Plane ◽  
Free Electron Lasers ◽  
Neutron Sources ◽  
X Ray ◽  
Infra Red

To observe diffraction from crystals it is necessary to have a source of radiation whose wavelength is of the same order as the atomic spacings. ‘Sources of radiation’ shows that the electromagnetic spectrum’s X-ray region does this nicely and describes the use of X-ray tubes. Another source of radiation is synchrotron radiation, which exhibits a number of special properties: the radiation emitted ranges from the hard X-ray region, through the ultraviolet and infra-red wavelengths up to visible light; the X-ray beam is plane-polarized within the horizontal plane; and the radiation is highly collimated in the vertical plane. Radiation from free-electron lasers, neutron sources, and electron diffraction is also discussed.

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