Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the CuK-edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

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First measurement of a phonon dispersion curve by inelastic X-ray scattering

Zeitschrift für Physik B Condensed Matter ◽

10.1007/bf01307274 ◽

1987 ◽

Vol 69 (2-3) ◽

pp. 179-183 ◽

Cited By ~ 47

Author(s):

B. Dorner ◽

E. Burkel ◽

Th. Illini ◽

J. Peisl

Keyword(s):

Dispersion Curve ◽

Phonon Dispersion ◽

Phonon Dispersion Curve ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Phonon dispersion curves in an argon single crystal at high pressure by inelastic x-ray scattering

Physical Review B ◽

10.1103/physrevb.63.224306 ◽

2001 ◽

Vol 63 (22) ◽

Cited By ~ 41

Author(s):

F. Occelli ◽

M. Krisch ◽

P. Loubeyre ◽

F. Sette ◽

R. Le Toullec ◽

...

Keyword(s):

High Pressure ◽

Single Crystal ◽

Phonon Dispersion ◽

Dispersion Curves ◽

Phonon Dispersion Curves ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Diffuse x-ray scattering study of single crystal alpha-AgI

Solid State Ionics ◽

10.1016/0167-2738(83)90176-5 ◽

1983 ◽

Vol 9-10 ◽

pp. 1347-1351 ◽

Cited By ~ 9

Author(s):

R.J Cava ◽

R.M Fleming ◽

E.A Rietman

Keyword(s):

Single Crystal ◽

X Ray ◽

X Ray Scattering ◽

Scattering Study ◽

Ray Scattering

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Single crystal structure analysis of the Se-incorporated mordenite, coupled with the anomalous X-ray scattering

Solid State Sciences ◽

10.1016/j.solidstatesciences.2010.10.018 ◽

2011 ◽

Vol 13 (4) ◽

pp. 684-690 ◽

Cited By ~ 5

Author(s):

N. Togashi ◽

K. Sugiyama ◽

J. Yu ◽

S. Qiu ◽

O. Terasaki

Keyword(s):

Crystal Structure ◽

Single Crystal ◽

Structure Analysis ◽

Crystal Structure Analysis ◽

Single Crystal Structure ◽

X Ray ◽

X Ray Scattering ◽

Single Crystal Structure Analysis ◽

Ray Scattering

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Phase transitions in Zr-rich lead zirconate-titanate studied by single-crystal diffuse and inelastic X-ray scattering

Acta Crystallographica Section A Foundations and Advances ◽

10.1107/s2053273319091277 ◽

2019 ◽

Vol 75 (a2) ◽

pp. e429-e429

Author(s):

Daria Andronikova ◽

Iurii Bronwald ◽

Alexei Bosak ◽

Dmitry Chernyshov ◽

Alexey Filimonov ◽

...

Keyword(s):

Phase Transitions ◽

Single Crystal ◽

Lead Zirconate Titanate ◽

Lead Zirconate ◽

X Ray ◽

X Ray Scattering ◽

Zirconate Titanate ◽

Ray Scattering

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Phonon dispersion curves in α-SiO2 and hcp 3He and 4He determined by inelastic X-ray scattering

Physica B Condensed Matter ◽

10.1016/s0921-4526(98)01399-4 ◽

1999 ◽

Vol 263-264 ◽

pp. 412-415 ◽

Cited By ~ 14

Author(s):

E Burkel ◽

C Seyfert ◽

Ch Halcoussis ◽

H Sinn ◽

R.O Simmons

Keyword(s):

Phonon Dispersion ◽

Dispersion Curves ◽

Phonon Dispersion Curves ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

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Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

Journal of Applied Crystallography ◽

10.1107/s0021889808031129 ◽

2008 ◽

Vol 41 (6) ◽

pp. 1134-1139 ◽

Cited By ~ 98

Author(s):

Youli Li ◽

Roy Beck ◽

Tuo Huang ◽

Myung Chul Choi ◽

Morito Divinagracia

Keyword(s):

High Resolution ◽

Single Crystal ◽

Small Angle ◽

Incident Beam ◽

Single Crystal Substrate ◽

X Ray Diffraction ◽

Metal Base ◽

X Ray ◽

X Ray Scattering ◽

Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

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