Phonon dispersion curves in an argon single crystal at high pressure by inelastic x-ray scattering

Small-angle X-ray scattering (SAXS) was performed on single-crystal chemical vapor deposition (CVD) diamonds with low nitrogen concentrations, which were fabricated by microwave plasma-assisted chemical vapor deposition at high growth rates. High optical quality undoped 500 µm-thick single-crystal CVD diamonds grown without intentional nitrogen addition proved to be excellent as windows on SAXS cells, yielding parasitic scattering no more intense than a 7.5 µm-thick Kapton film. A single-crystal CVD diamond window was successfully used in a high-pressure SAXS cell.

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Momentum-resolved resonant inelastic X-ray scattering on a single crystal under high pressure

Journal of Synchrotron Radiation ◽

10.1107/s1600577513028944 ◽

2013 ◽

Vol 21 (1) ◽

pp. 131-135 ◽

Cited By ~ 3

Author(s):

Masahiro Yoshida ◽

Kenji Ishii ◽

Ignace Jarrige ◽

Tetsu Watanuki ◽

Kazutaka Kudo ◽

...

Keyword(s):

High Pressure ◽

Single Crystal ◽

Diamond Anvil Cell ◽

Ambient Pressure ◽

Electronic Excitations ◽

X Ray ◽

X Ray Scattering ◽

Angle Condition ◽

Diamond Anvil ◽

Ray Scattering

A single-crystal momentum-resolved resonant inelastic X-ray scattering (RIXS) experiment under high pressure using an originally designed diamond anvil cell (DAC) is reported. The diamond-in/diamond-out geometry was adopted with both the incident and scattered beams passing through a 1 mm-thick diamond. This enabled us to cover wide momentum space keeping the scattering angle condition near 90°. Elastic and inelastic scattering from the diamond was drastically reduced using a pinhole placed after the DAC. Measurement of the momentum-resolved RIXS spectra of Sr2.5Ca11.5Cu24O41at the CuK-edge was thus successful. Though the inelastic intensity becomes weaker by two orders than the ambient pressure, RIXS spectra both at the center and the edge of the Brillouin zone were obtained at 3 GPa and low-energy electronic excitations of the cuprate were found to change with pressure.

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Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the CuK-edge

Journal of Synchrotron Radiation ◽

10.1107/s1600577515009686 ◽

2015 ◽

Vol 22 (4) ◽

pp. 961-967 ◽

Cited By ~ 21

Author(s):

Didem Ketenoglu ◽

Manuel Harder ◽

Konstantin Klementiev ◽

Mary Upton ◽

Mehran Taherkhani ◽

...

Keyword(s):

Single Crystal ◽

Phonon Dispersion ◽

Phonon Dispersion Curve ◽

X Ray ◽

X Ray Scattering ◽

Single Crystal Quartz ◽

Crystal Quartz ◽

Edge Based ◽

Ray Tracing Simulation ◽

Ray Scattering

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

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