scholarly journals Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques

2016 ◽  
Vol 23 (6) ◽  
pp. 1474-1483 ◽  
Author(s):  
N. Gueninchault ◽  
H. Proudhon ◽  
W. Ludwig
Keyword(s):  
Mechanical Test ◽  
Imaging Techniques ◽  
Imaging Modalities ◽  
Diffraction Spot ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Contrast ◽  
Peak Broadening

Multi-modal characterization of polycrystalline materials by combined use of three-dimensional (3D) X-ray diffraction and imaging techniques may be considered as the 3D equivalent of surface studies in the electron microscope combining diffraction and other imaging modalities. Since acquisition times at synchrotron sources are nowadays compatible with four-dimensional (time lapse) studies, suitable mechanical testing devices are needed which enable switching between these different imaging modalities over the course of a mechanical test. Here a specifically designed tensile device, fulfilling severe space constraints and permitting to switch between X-ray (holo)tomography, diffraction contrast tomography and topotomography, is presented. As a proof of concept the 3D characterization of an Al–Li alloy multicrystal by means of diffraction contrast tomography is presented, followed by repeated topotomography characterization of one selected grain at increasing levels of deformation. Signatures of slip bands and sudden lattice rotations inside the grain have been shown by means ofin situtopography carried out during the load ramps, and diffraction spot peak broadening has been monitored throughout the experiment.

scholarly journals Three-Dimensional Characterization of Polycrystalline Materials by Combination of X-ray Diffraction and X-ray Imaging Techniques

2009 ◽  
Vol 15 (S2) ◽  
pp. 616-617
Author(s):  
EM Lauridsen ◽  
W Ludwig ◽  
SO Poulsen ◽  
S Rolland du Roscoat ◽  
P Reischig ◽  
...  
Keyword(s):  
Imaging Techniques ◽  
Three Dimensional ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements

2004 ◽  
Vol 51 (1) ◽  
pp. 59-63 ◽  
Author(s):  
Sanjay K. Rai ◽  
Anish Kumar ◽  
Vani Shankar ◽  
T. Jayakumar ◽  
K. Bhanu Sankara Rao ◽  
...  
Keyword(s):  
Lattice Parameter ◽  
Diffraction Peak ◽  
Inconel 625 ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Synthesis and Characterization of Ba0.3Sr0.7ZrO3 Ceramic Thick Films Prepared by Sol-Gel Technique

2012 ◽  
Vol 620 ◽  
pp. 435-439 ◽  
Author(s):  
Wan Fahmin Faiz Wan Ali ◽  
Mohamad Ariff Othman ◽  
Nik Akmar Rejab ◽  
Mohd Zaid Abdullah ◽  
Arjuna Marzuki ◽  
...  
Keyword(s):  
Thick Films ◽  
Sol Gel ◽  
Dendritic Structure ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Gel Technique ◽  
Electrical Permittivity ◽  
Electrical Characterizations

This manuscript is explained and discussed the properties of ceramic thick films, [Ba0.3Sr0.7ZrO3,BSZ (0.7)] synthesized through sol-gel route. The gel decomposition was studied by thermogravinometry analysis (TGA). From thermal analysis, it had shown that BSZ (0.7) phase started formed at 800 °C and above. The crystal structure of this composite film studied exhibited highly polycrystalline materials by X-ray diffraction analysis. From high magnification observation of field emission scanning electron microscopy (FESEM), grain boundaries of BSZ (0.7) films are clearly defined meanwhile grains displayed are in flaky shape. The average diameters of the grains measured were 94.6 nm. However, grains boundaries of BSZ (0.0) films, are unclear and grains slightly look dendritic structure. Electrical characterizations of the films are carried out with impedance analyzer at 4 - 12 GHz respectively. Both of electrical permittivity and loss tangent observed are dependable with microstructural and structural of the films.

Portland Cement for the Cementing of Oil Wells Developed with the Aid of the Rietveld Refinement Method

2014 ◽  
Vol 805 ◽  
pp. 350-355
Author(s):  
Danielle Nascimento Silva Oliveira ◽  
Gelmires Araújo Neves ◽  
Ulisses Targino Bezerra ◽  
Alexsandra C. Chaves ◽  
B. Silveira Lira
Keyword(s):  
Linear Programming ◽  
Portland Cement ◽  
Rietveld Refinement ◽  
Polycrystalline Materials ◽  
Oil Well ◽  
X Ray Diffraction ◽  
X Ray ◽  
Refinement Method ◽  
Low Levels

The use of the Rietveld refinement method has been highlightened as essential in the characterization of polycrystalline materials. With the aid of this method, combined with the application of the X-ray diffraction, it was possible to develop a type of cement that can temporarily substitute the Portland cement for Oil well. This cement was developed from the mixture of Portland cements commonly found in the market. The cements were passed through various sieves, then characterized by X-ray diffraction, being identified the main phases (C3A, C4AF, C3S and C2S) and quantified by the Rietveld refinement method. With the values obtained in the quantification of the phases, a new cement was made through the method of linear programming. From the results, it was possible to conclude that the developed cement presented a composition (levels of the main phases) that satisfies the requirements of NBR 9831, mainly in relation to the low levels of C3A.

Characterization of precipitation in Al–Mg–Cu alloys by X-ray diffraction peak broadening analysis

2008 ◽  
Vol 59 (6) ◽  
pp. 773-780 ◽  
Author(s):  
O. Novelo-Peralta ◽  
G. González ◽  
G.A. Lara-Rodríguez
Keyword(s):  
Diffraction Peak ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cu Alloys ◽  
Peak Broadening

Three Dimensional Characterization of Grain Structures by EBSP and 3DXRD

2007 ◽  
Vol 558-559 ◽  
pp. 751-756 ◽  
Author(s):  
Kristofer Hannesson ◽  
Dorte Juul Jensen
Keyword(s):  
Three Dimensional ◽  
Polycrystalline Materials ◽  
Serial Sectioning ◽  
X Ray Diffraction ◽  
X Ray ◽  
3D Structures ◽  
3 Dimensional ◽  
Grain Structures ◽  
Non Destructive

Grain structures in polycrystalline materials are typically three dimensional (3D) structures, but by far the most characterizations of grain structures are done by microscopy and are thus limited to 2D. In the present work 3D grain structures in a well-annealed cylindrical aluminium (AA1050) sample is characterized and analyzed. The characterization is done by 2 methods i) by non-destructive 3-dimensional x-ray diffraction (3DXRD) ii) by serial sectioning and subsequent EBSP mapping of entire circular 2D sample sections; 50 sections are mapped In total 333 grains are reconstructed. It is found that the 3D grain morphologies can be quite complex in particular for the larger grains, the number of neighbours varies significantly and values above 20 are not unusual. When the results from the 2 methods are compared, it is found that the crystallographic agreement is very good and within experimental uncertainties. Slightly more significant differences are found when the reconstructed grain morphologies are compared. Reasons for this are discussed.

X-Ray Diffraction for Nondestructive Characterization of Polycrystalline Materials

1988 ◽  
Vol 142 ◽  
Author(s):  
C. O. Ruud ◽  
S. D. Weedman
Keyword(s):  
Computer Control ◽  
Polycrystalline Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Position Sensitive ◽  
Computer Controlled ◽  
Xrd Techniques ◽  
Nondestructive Characterization

AbstractX-ray diffraction has long been the mainstay for materials characterization in the laboratory. This characterization includes the determination of phase composition, residual stress, microstrain, grain size, and crystallographic texture of polycrystalline metals, ceramics, and minerals. The analytical capabilities of XRD techniques have been expanded recently by the application of computer control to data collection and processing. These capabilities include the identification of irregularities in metals and ceramics that are caused by processing and fatigue damage, as well as the apriori prediction of processing anomolies. While the above applications have been largely restricted to the laboratory, the possibility for exploitation of the nondestructive nature of x-ray diffraction for inprocess evaluation of materials is now being realized. The availability of computer-controlled position-sensitive x-ray detectors can now provide rapid, non-contacting, in-process interrogation of materials. The examples of nondestructive characterization illustrated in this paper will be those that can be used for process control and/or damage assessment.

Production and Characterization of Zinc Substituted Hydroxyapatite

2007 ◽  
Vol 361-363 ◽  
pp. 159-162 ◽  
Author(s):  
David Shepherd ◽  
Serena Best
Keyword(s):  
Mechanical Test ◽  
Ammonium Phosphate ◽  
Zinc Content ◽  
Rietveld Analysis ◽  
Lattice Parameter ◽  
Zinc Nitrate ◽  
Precipitation Method ◽  
X Ray Diffraction ◽  
X Ray

Zinc substituted hydroxyapatite of varying wt% was produced using a precipitation method based on reacting calcium and zinc nitrate with ammonium phosphate. Characterisation results from X-ray diffraction (XRD) and X-ray fluorescence spectroscopy (XRF) showed that zinc was successfully substituted up to 0.8wt% using this method. Rietveld analysis showed that the alattice parameter was reduced and c-lattice parameter was increased with increasing zinc content. Initial mechanical test results showed samples with a zinc content of 0.4% had the greatest compressive strength.

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