Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements

2004 ◽  
Vol 51 (1) ◽  
pp. 59-63 ◽  
Author(s):  
Sanjay K. Rai ◽  
Anish Kumar ◽  
Vani Shankar ◽  
T. Jayakumar ◽  
K. Bhanu Sankara Rao ◽  
...  
Keyword(s):  
Lattice Parameter ◽  
Diffraction Peak ◽  
Inconel 625 ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Characterization of precipitation in Al–Mg–Cu alloys by X-ray diffraction peak broadening analysis

2008 ◽  
Vol 59 (6) ◽  
pp. 773-780 ◽  
Author(s):  
O. Novelo-Peralta ◽  
G. González ◽  
G.A. Lara-Rodríguez
Keyword(s):  
Diffraction Peak ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cu Alloys ◽  
Peak Broadening

Problems Associated with Kα Doublet in Residual Stress Measurements

1979 ◽  
Vol 23 ◽  
pp. 333-339
Author(s):  
S. K. Gupta ◽  
B. D. Cullity
Keyword(s):  
Residual Stress ◽  
Silicon Powder ◽  
Lattice Parameter ◽  
Diffraction Peak ◽  
Parameter Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Analysis Techniques ◽  
The Difference ◽  
Similar Accuracy

Since the measurement of residual stress by X-ray diffraction techniques is dependent on the difference in angle of a diffraction peak maximum when the sample is examined consecutively with its surface at two different angles to the diffracting planes, it is important that these diffraction angles be obtained precisely, preferably with an accuracy of ± 0.01 deg. 2θ. Similar accuracy is desired in precise lattice parameter determination. In such measurements, it is imperative that the diffractometer be well-aligned. It is in the context of diffractometer alignment with the aid of a silicon powder standard free of residual stress that the diffraction peak analysis techniques described here have been developed, preparatory to residual stress determinations.

scholarly journals MOVPE Growth of Quaternary (Al,Ga,In)N for UV Optoelectronics

2000 ◽  
Vol 5 (S1) ◽  
pp. 412-424
Author(s):  
Jung Han ◽  
Jeffrey J. Figiel ◽  
Gary A. Petersen ◽  
Samuel M. Myers ◽  
Mary H. Crawford ◽  
...  
Keyword(s):  
Room Temperature ◽  
Rutherford Backscattering Spectrometry ◽  
Optoelectronic Devices ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Energy ◽  
Movpe Growth ◽  
Pl Emission

We report the growth and characterization of quaternary AlGaInN. A combination of photoluminescence (PL), high-resolution x-ray diffraction (XRD), and Rutherford backscattering spectrometry (RBS) characterizations enables us to explore the contours of constant- PL peak energy and lattice parameter as functions of the quaternary compositions. The observation of room temperature PL emission at 351nm (with 20% Al and 5% In) renders initial evidence that the quaternary could be used to provide confinement for GaInN (and possibly GaN). AlGaInN/GaInN MQW heterostructures have been grown; both XRD and PL measurements suggest the possibility of incorporating this quaternary into optoelectronic devices.

MOVPE Growth of Quaternary (Al,Ga,In)N for UV Optoelectronics

1999 ◽  
Vol 595 ◽  
Author(s):  
Jung Han ◽  
Jeffrey J. Figiel ◽  
Gary A. Petersen ◽  
Samuel M. Myers ◽  
Mary H. Crawford ◽  
...  
Keyword(s):  
Room Temperature ◽  
Rutherford Backscattering Spectrometry ◽  
Optoelectronic Devices ◽  
Lattice Parameter ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Energy ◽  
Movpe Growth ◽  
Pl Emission

AbstractWe report the growth and characterization of quaternary AlGaInN. A combination of photoluminescence (PL), high-resolution x-ray diffraction (XRD), and Rutherford backscattering spectrometry (RBS) characterizations enables us to explore the contours of constant- PL peak energy and lattice parameter as functions of the quaternary compositions. The observation of room temperature PL emission at 351nm (with 20% Al and 5% In) renders initial evidence that the quaternary could be used to provide confinement for GaInN (and possibly GaN). AlGaInN/GaInN MQW heterostructures have been grown; both XRD and PL measurements suggest the possibility of incorporating this quaternary into optoelectronic devices.

Crystallite size and lattice strain of lithiated spinel material for rechargeable battery by X-ray diffraction peak-broadening analysis

2019 ◽  
Vol 43 (5) ◽  
pp. 1903-1911 ◽  
Author(s):  
Ahmed A. Al-Tabbakh ◽  
Nilgun Karatepe ◽  
Aseel B. Al-Zubaidi ◽  
Aida Benchaabane ◽  
Natheer B. Mahmood
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Diffraction Peak ◽  
Rechargeable Battery ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

2009 ◽  
Vol 42 (4) ◽  
pp. 673-680 ◽  
Author(s):  
Valeriy A. Luchnikov ◽  
Dimitri A. Ivanov
Keyword(s):  
Basal Plane ◽  
Peak Position ◽  
Diffraction Peak ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Asymmetric Shape ◽  
Diffraction Peaks ◽  
Lamellar Crystals

The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites.

SYNTHESIS AND CHARACTERIZATION OF NANOCRYSTALLINE FeNi AND Ni3Fe ALLOYS

2011 ◽  
Vol 25 (07) ◽  
pp. 1013-1019 ◽  
Author(s):  
S. AZADEHRANJBAR ◽  
F. KARIMZADEH ◽  
M. H. ENAYATI
Keyword(s):  
Ball Mill ◽  
Morphological Evolution ◽  
Lattice Parameter ◽  
Internal Stresses ◽  
Alloy Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Powder Particles ◽  
Fe Alloys

Nanocrystalline FeNi and Ni 3 Fe alloys were prepared by mechanical alloying of Fe and Ni elemental powders using a planetary ball mill under protection atmosphere. X-ray diffraction measurements were performed to follow alloy formation process in these alloys. A heat treatment of 1 h at 800°C was carried out to relax the internal stresses of the milled samples. Morphological evolution of powder particles was revealed by scanning electron microscopy. The value of lattice parameter was reached to 0.35762 nm and the hardness was found to be 686 HV at 30 h milled FeNi powder. In the case of Ni 3 Fe the values of 0.3554 nm and 720 HV were obtained for lattice parameter and hardness, respectively.

Studied on Structural Characterization of Lanthanum Doped Barium Titanium Ceramics

2015 ◽  
Vol 819 ◽  
pp. 198-203
Author(s):  
Nur Farahin Abdul Hamid ◽  
Rozana Aina Maulat Osman ◽  
Mohd Sobri Idris ◽  
Tze Qing Tan
Keyword(s):  
Crystal Structure ◽  
Lattice Parameter ◽  
Phase Changes ◽  
X Ray Diffraction ◽  
X Ray ◽  
Tetragonal Crystal ◽  
Tetragonal Crystal Structure ◽  
La Doped ◽  
Conventional Solid State Synthesis

La-doped barium titanate (BaTiO3) was prepared using conventional solid state synthesis route. All peaks for sample x=0 are approaching the phase pure of BaTiO3 structure with tetragonal crystal structure (P4mm). Sintering of pressed powder are performed at 1300oC, 1400oC and 1450oC for overnight for pure BaTiO3 and 1350oC for 3 days for BaTiO3 doped lanthanum with intermittent grinding. Phase transition was studied by different x composition. The changes in the crystal structure of the composition x=0.1 and 0.2 were detected by using X-ray diffraction (XRD). The phase changes between tetragonal-cubic and cubic-tetragonal depending on the temperature. Rietveld Refinement analysis is carried out to determine the lattice parameter and unit cell for BaTiO3.

Preparation of LaFeO3 particles by sol-gel technology

1998 ◽  
Vol 13 (2) ◽  
pp. 451-456 ◽  
Author(s):  
C. Vázquez-Vázquez ◽  
P. Kögerler ◽  
M. A. López-Quintela ◽  
R. D. Sánchez ◽  
J. Rivas
Keyword(s):  
Particle Size ◽  
Magnetic Properties ◽  
Infrared Spectroscopy ◽  
Sol Gel ◽  
Diffraction Peak ◽  
Gel Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ferromagnetic Component ◽  
Peak Broadening

The study of submicroscopic particles in already known systems has resulted in a renewed interest due to the large differences found in their properties when the particle size is reduced, and because of possible new technological applications. In this work we report the preparation of LaFeO3 particles by the sol-gel route, starting from a solution of the corresponding metallic nitrates and using urea as gelificant agent. Gels were decomposed at 200 °C and calcined 3 h at several temperatures, T, in the range 250–1000 °C. The samples were structurally characterized by x-ray diffraction (XRD) showing that the orthoferrite crystallizes at T as low as 315 °C. From the x-ray diffraction peak broadening, the particle size was determined. The size increases from 60 to 300 nm as the calcination T increases. Infrared spectroscopy was used to characterize gels and calcined samples. From these studies a mechanism for the gel formation is proposed. Study of the magnetic properties of LaFeO3 particles shows the presence of a ferromagnetic component which diminishes as the calcination temperature increases, vanishing at T = 1000 °C.

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