ACCURATE CHARGE‐INTEGRALS EVALUATION IN TWO‐DIMENSIONAL FINITE‐ELEMENT SEMICONDUCTOR‐DEVICE SIMULATION

COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering ◽

10.1108/eb009964 ◽

1982 ◽

Vol 1 (1) ◽

pp. 37-51 ◽

Author(s):

MASSIMO RUDAN

Keyword(s):

Finite Element ◽

Semiconductor Device ◽

Device Simulation ◽

Two Dimensional ◽

Semiconductor Device Simulation ◽

Dimensional Finite Element

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Three-dimensional semiconductor device simulation by finite element method coupled to Monte Carlo method

IEEE Transactions on Magnetics ◽

10.1109/20.717582 ◽

1998 ◽

Vol 34 (5) ◽

pp. 2525-2528 ◽

Author(s):

D. Hadji ◽

Y. Marechal ◽

J. Zimmermann

Keyword(s):

Finite Element Method ◽

Finite Element ◽

Monte Carlo ◽

Monte Carlo Method ◽

Semiconductor Device ◽

Three Dimensional ◽

Device Simulation ◽

Semiconductor Device Simulation ◽

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Two-dimensional semiconductor device simulation of trap-assisted generation-recombination noise under periodic large-signal conditions and its use for developing cyclostationary circuit simulation models

IEEE Transactions on Electron Devices ◽

10.1109/ted.2003.813448 ◽

2003 ◽

Vol 50 (5) ◽

pp. 1353-1362 ◽

Author(s):

J.E. Sanchez ◽

G. Bosman ◽

M.E. Law

Keyword(s):

Semiconductor Device ◽

Circuit Simulation ◽

Device Simulation ◽

Simulation Models ◽

Two Dimensional ◽

Large Signal ◽

Semiconductor Device Simulation

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Finite-element methods in semiconductor device simulation

IEEE Transactions on Electron Devices ◽

10.1109/t-ed.1977.18880 ◽

1977 ◽

Vol 24 (8) ◽

pp. 1082-1089 ◽

Author(s):

J.J. Barnes ◽

R.J. Lomax

Keyword(s):

Finite Element ◽

Finite Element Methods ◽

Semiconductor Device ◽

Device Simulation ◽

Semiconductor Device Simulation

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A two-dimensional finite element algorithm for the simultaneous solution of the semiconductor device equations with automatic convergence

International Journal for Numerical Methods in Engineering ◽

10.1002/nme.1620230409 ◽

1986 ◽

Vol 23 (4) ◽

pp. 635-649

Author(s):

G. A. Armstrong ◽

R. S. Ferguson ◽

J. Flynn

Keyword(s):

Finite Element ◽

Semiconductor Device ◽

Two Dimensional ◽

Simultaneous Solution ◽

Dimensional Finite Element ◽

Element Algorithm

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New discretization scheme for two-dimensional semiconductor device simulation on triangular grid

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.736188 ◽

1998 ◽

Vol 17 (11) ◽

pp. 1160-1165 ◽

Author(s):

M.B. Patil

Keyword(s):

Semiconductor Device ◽

Device Simulation ◽

Triangular Grid ◽

Two Dimensional ◽

Discretization Scheme ◽

Semiconductor Device Simulation

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Mixed Finite Element Discretization of Continuity Equations Arising in Semiconductor Device Simulation

Mathematical Modelling and Simulation of Electrical Circuits and Semiconductor Devices ◽

10.1007/978-3-0348-8528-7_16 ◽

1994 ◽

pp. 197-217 ◽

Author(s):

R. Hiptmair ◽

R. H. W. Hoppe

Keyword(s):

Finite Element ◽

Semiconductor Device ◽

Mixed Finite Element ◽

Device Simulation ◽

Finite Element Discretization ◽

Element Discretization ◽

Semiconductor Device Simulation ◽

Continuity Equations

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New approach to two-dimensional semiconductor device simulation on curvilinear grids

Solid-State Electronics ◽

10.1016/s0038-1101(96)00173-6 ◽

1997 ◽

Vol 41 (5) ◽

pp. 789-792 ◽

Author(s):

M.B Patil

Keyword(s):

Semiconductor Device ◽

Device Simulation ◽

Two Dimensional ◽

New Approach ◽

Semiconductor Device Simulation ◽

Curvilinear Grids

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Two-dimensional finite element modeling of constrained-layer damping

10.1117/12.174103 ◽

1994 ◽

Author(s):

Duane E. Veley ◽

S. S. Rao

Keyword(s):

Finite Element ◽

Finite Element Modeling ◽

Constrained Layer Damping ◽

Two Dimensional ◽

Element Modeling ◽

Dimensional Finite Element

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Optimization of Two-Dimensional Finite Element on Primary Bone Type-7 Fracture Model

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/917/1/012028 ◽

2020 ◽

Vol 917 ◽

pp. 012028

Author(s):

N N Mansor ◽

M I Ishak ◽

R Daud

Keyword(s):

Finite Element ◽

Fracture Model ◽

Two Dimensional ◽

Dimensional Finite Element ◽

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Two-dimensional Finite Element Based Parametric Analysis of South Portal Slope, Rohtang Tunnel, India

Procedia Engineering ◽

10.1016/j.proeng.2016.12.172 ◽

2017 ◽

Vol 173 ◽

pp. 1330-1333

Author(s):

K.S. Rao ◽

Tarun Singh

Keyword(s):

Finite Element ◽

Parametric Analysis ◽

Two Dimensional ◽

Dimensional Finite Element

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