Characterization method for ionizing radiation degradation in power MOSFETs
1995 ◽
Vol 42
(6)
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pp. 1622-1627
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2019 ◽
Vol 658
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pp. 1367-1374
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2020 ◽
Vol 104
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pp. 113554
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1990 ◽
Vol 37
(6)
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pp. 2076-2082
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2003 ◽
Vol 66
(2)
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pp. 137-143
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2018 ◽
Vol 88-90
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pp. 941-945
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1982 ◽
Vol 29
(6)
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pp. 1555-1558
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Keyword(s):
1983 ◽
Vol 30
(6)
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pp. 4116-4121
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1994 ◽
Vol 41
(6)
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pp. 2530-2535
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1988 ◽
Vol 35
(6)
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pp. 1422-1427
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