Modelling of orientation relations in 2-D percolative systems of buffered metallic substrates for coated conductors

2001 ◽  
Vol 11 (1) ◽  
pp. 2730-2733 ◽  
Author(s):  
N.A. Rutter ◽  
B.A. Glowacki
2010 ◽  
Vol 470 (13-14) ◽  
pp. 543-546 ◽  
Author(s):  
L.L. Ying ◽  
F. Fan ◽  
B. Gao ◽  
Y.M. Lu ◽  
Z.Y. Liu ◽  
...  

2001 ◽  
Vol 357-360 ◽  
pp. 979-982 ◽  
Author(s):  
SeokBeom Kim ◽  
Toshihiko Maeda ◽  
Yasuji Yamada ◽  
Toshihiro Suga ◽  
Yutaka Yamada ◽  
...  

2009 ◽  
Vol 469 (15-20) ◽  
pp. 1311-1315 ◽  
Author(s):  
T. Nagaishi ◽  
Y. Shingai ◽  
M. Konishi ◽  
T. Taneda ◽  
H. Ota ◽  
...  

2000 ◽  
Vol 14 (25n27) ◽  
pp. 3128-3133
Author(s):  
A. MANCINI ◽  
V. BOFFA ◽  
G. CELENTANO ◽  
L. CIONTEA ◽  
M. DAMASCENI ◽  
...  

Y 2 O 3 and MgO-based buffer layer architectures on non-magnetic cube textured Ni-V substrates were studied for YBa 2 Cu 3 O 7-δ (YBCO) coated conductors fabrication using both pulsed laser deposition and electron beam evaporation. The Y 2 O 3 films exhibited a biaxial texture with φ and ω-scans full width at half maximum (FWHM) of about 11° and 7° and a smooth and continuous surface. YBCO thick films deposited on CeO 2/ Y 2 O 3/ Ni-V and CeO 2/ Y 2 O 3/ NiO/Ni-V architectures were mainly c-axis oriented showing a T C(R=0) above 85 K. MgO films were grown by electron beam evaporation both directly on metallic substrates and with a Pd intermediate layer. The MgO films grown on Ni-V substrates show a good texture and good surface morphological properties. The MgO deposition on Pd buffered Ni-V substrate leads to films with better structural properties with respect to MgO deposition on bare Ni-V substrate, showing φ and ω-scans FWHM up to 8° and 5°, respectively. In spite of the interdiffusion between Pd buffer layer and Ni-V substrate, the MgO films preserve their structural and morphological properties when annealed at typical YBCO deposition temperature.


2000 ◽  
Vol 659 ◽  
Author(s):  
Yimin Chen ◽  
Xin Chen ◽  
Zhongjia Tang ◽  
PenChu Chou ◽  
Xin Zhang ◽  
...  

ABSTRACTYBa2Cu3O7 (YBCO) films have been deposited by photo-assisted MOCVD at rates of greater than 0.3μm/min on both single crystal oxide substrates and atomically textured metallic substrates. The YBCO films of thickness from 0.5μm to 3μm deposited on LaAlO3 substrates are shown to be highly atomically ordered with Jc> 1 × 106 A/cm2. CeO2 buffer layers have also been developed by photo-assisted MOCVD for the integration of YBCO with metallic substrates. The CeO2 layers were found to be crack-free when grown on nickel even above 1 micron thickness, and exhibited crystal orientation and in-plane alignment similar to that of the atomically textured Ni substrates. YBCO films grown on the thick CeO2 buffer layers on nickel substrates have shown promising results with Jc∼6 × 105 A/cm2.


2004 ◽  
Vol 18 (1) ◽  
pp. 9-13 ◽  
Author(s):  
Nicholas A Yust ◽  
Rama Nekkanti ◽  
Lyle B Brunke ◽  
Raghavan Srinivasan ◽  
Paul N Barnes

2000 ◽  
Vol 14 (25n27) ◽  
pp. 3139-3144 ◽  
Author(s):  
A. TUISSI ◽  
R. MASINI ◽  
E. VILLA ◽  
J. E. EVETTS

CuNi, NiCr, NiV alloys and pure Ni have been processed to obtain metallic substrates for high critical current density YBCO film depositions. High purity alloys were prepared using plasma arc furnace and the material was cold rolled to low thickness tapes. For all the tapes the (100)[001] cube alignment was induced by a primary recrystallization heat treatment after heavy cold rolling (RABITS). Besides the cube texture a good substrate should be smooth, thin, strong, non magnetic, resistant to oxidation, cold workable and low cost. In this work mechanical, magnetic and oxidation resistance properties of the prepared textured substrates were measured and compared.


1998 ◽  
Vol 526 ◽  
Author(s):  
C. Varanasi ◽  
R.R. Biggers ◽  
I. Maartense ◽  
D. Dempsey ◽  
T.L. Peterson ◽  
...  

AbstractPulsed-laser ablation was used to deposit YBa2Cu3O7-x (YBCO) films on LaAlO3 and metallic substrates in an effort to understand and develop the processing of coated conductors with enhanced properties. Doping of YBCO films with Nd was utilized as an approach for increasing their flux pinning properties. Separate targets of Nd2O3 and YBCO were used instead of a pre-mixed Nd2O3-YBCO target. The critical current density (Jc) of the films was measured by whole body dc transport measurements and the transition temperature (Tc) by ac susceptibility. The composition vs. depth profiles of the films were obtained by Secondary Ion Mass Spectrometry. The critical current of a 5000 Å thick Nd-doped YBCO film on a LaAlO3 substrate was measured at 77 K and found to be 57 A (Jc = 1.1×106 A/cm2).


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