Deposition of Gd2Zr2O7 single buffer layers with different thickness for YBa2Cu3O7−δ coated conductors on metallic substrates

2010 ◽  
Vol 470 (13-14) ◽  
pp. 543-546 ◽  
Author(s):  
L.L. Ying ◽  
F. Fan ◽  
B. Gao ◽  
Y.M. Lu ◽  
Z.Y. Liu ◽  
...  
Keyword(s):  
Coated Conductors ◽  
Buffer Layers ◽  
Metallic Substrates ◽  
Different Thickness

Fabrication of seed/buffer layers on metallic substrates for YBCO coated conductors

2001 ◽  
Vol 357-360 ◽  
pp. 979-982 ◽  
Author(s):  
SeokBeom Kim ◽  
Toshihiko Maeda ◽  
Yasuji Yamada ◽  
Toshihiro Suga ◽  
Yutaka Yamada ◽  
...  
Keyword(s):  
Coated Conductors ◽  
Buffer Layers ◽  
Metallic Substrates ◽  
Ybco Coated Conductors

Development of High Critical Current YBCO Coated Conductors By Photo-Assisted MOCVD

2000 ◽  
Vol 659 ◽  
Author(s):  
Yimin Chen ◽  
Xin Chen ◽  
Zhongjia Tang ◽  
PenChu Chou ◽  
Xin Zhang ◽  
...  
Keyword(s):  
Single Crystal ◽  
Critical Current ◽  
Crystal Orientation ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Ybco Films ◽  
Metallic Substrates ◽  
Oxide Substrates ◽  
Nickel Substrates ◽  
Ybco Coated Conductors

ABSTRACTYBa2Cu3O7 (YBCO) films have been deposited by photo-assisted MOCVD at rates of greater than 0.3μm/min on both single crystal oxide substrates and atomically textured metallic substrates. The YBCO films of thickness from 0.5μm to 3μm deposited on LaAlO3 substrates are shown to be highly atomically ordered with Jc> 1 × 106 A/cm2. CeO2 buffer layers have also been developed by photo-assisted MOCVD for the integration of YBCO with metallic substrates. The CeO2 layers were found to be crack-free when grown on nickel even above 1 micron thickness, and exhibited crystal orientation and in-plane alignment similar to that of the atomically textured Ni substrates. YBCO films grown on the thick CeO2 buffer layers on nickel substrates have shown promising results with Jc∼6 × 105 A/cm2.

MOD oxide buffer layers on metallic substrates for YBCO coated conductors

2013 ◽  
Vol 1579 ◽  
Author(s):  
A. Augieri ◽  
M.R. Mancini ◽  
A. Vannozzi ◽  
A. A. Angrisani ◽  
F. Fabbri ◽  
...  
Keyword(s):  
Coated Conductors ◽  
Buffer Layers ◽  
Recrystallization Process ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
Metallic Substrates ◽  
Force Microscopy ◽  
Atomic Force ◽  
Metal Organic ◽  
Ft Ir

ABSTRACTWe present a detailed study carried out on oxide buffer layers grown by Metal-Organic Decomposition (MOD) on metallic substrates for YBa2Cu3O7-x (YBCO) coated conductor applications. Precursor solutions have been made starting from acetates or pentanedionates and characterized by means of Differential Scanning Calorimetry (DSC) and Thermogravimetric (TG) analyses coupled with Fourier Transform Infra-Red spectroscopy (FT-IR). Thin buffer layers have been grown by spin-coating on Ni-5at.%W substrates. X-ray diffraction spectra (XRD), Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM) have been employed in order to optimize buffer layers in terms of film microstructure and surface quality, with the final aims of producing a suitable template for YBCO growth. It will be shown that the optimization of the recrystallization process can lead to high quality buffer layer allowing the growth of YBCO films showing good superconductive properties.

Experimental Design and Investigation of Novel Pulsed Laser Deposited Structures for YBCO Based Coated Conductors

2013 ◽  
Vol 1579 ◽  
Author(s):  
Francesco Rizzo ◽  
Antonella Mancini ◽  
Angelo Vannozzi ◽  
Andrea Augieri ◽  
Achille Angrisani Armenio ◽  
...  
Keyword(s):  
Single Crystal ◽  
Ybco Film ◽  
Pulsed Laser ◽  
Temperature Stability ◽  
Coated Conductors ◽  
Buffer Layers ◽  
High Quality ◽  
Ybco Films ◽  
Metallic Substrates ◽  
Large Current

ABSTRACTThe study of high quality YBa2Cu3O7-x (YBCO) based superconducting films is a fundamental issue to be addressed when dealing with the realization of efficient coated conductors with large current carrying capacity. In this perspective the investigation of innovative buffer layers structures able to allow epitaxial YBCO film grow on metallic substrates and to prevent contamination and degradation issues holds a central role.In this work we thoroughly study the properties of YBCO films grown by means of pulsed lasers deposition on CeO2 template on both bare MgO single crystal and MgO-homoepitaxial/MgO single crystal substrates. Due to its high chemical and temperature stability the MgO reduces the oxygen diffusion effects. On the other hand, the CeO2 layer, pulsed laser deposited, prevents the YBCO film from metallic contamination and facilitates its epitaxial growth. Morphology and crystalline structure of buffer layers and superconductors film are investigated by using scanning electron microscopy (SEM), X-ray and electrons back-scattered diffraction techniques (XRD and EBSD).YBCO films show good critical temperature values (Tc > 87K) with sharp transitions. These encouraging results make our structures promising candidates in the realization of high quality YBCO based coated conductors.

Oxidation of carbon on nickel-based metallic substrates: Implications for high-temperature superconductor coated conductors

2005 ◽  
Vol 20 (3) ◽  
pp. 765-773 ◽  
Author(s):  
F.A. List ◽  
L. Heatherly ◽  
D.F. Lee ◽  
K.J. Leonard ◽  
A. Goyal
Keyword(s):  
High Temperature ◽  
High Temperature Superconductor ◽  
Thermal Desorption Spectroscopy ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Carbon Oxidation ◽  
Metal Interface ◽  
Metallic Substrates ◽  
Alloy Substrate ◽  
Epitaxial Oxide

Adhesion of thin films of epitaxial oxides to nickel-based metallic substrates is important for the successful development of high-temperature superconductor coated conductors. Detachment of epitaxial oxide buffer layers at the oxide/metal interface during either oxide growth or subsequent processing renders the conductor useless. In this study, thermal desorption spectroscopy (TDS) has been used to identify and understand one of the causes of buffer layer detachment, oxidation of carbon at the oxide–metal interface to form carbon monoxide. Results of TDS indicate that on the surface of a bare nickel-based alloy substrate, the rate of carbon oxidation depends on both the supply of carbon from the substrate and the supply of oxygen from the vapor. Sulfur at the surface of the alloy substrate reduces the rate of carbon oxidation. The effectiveness of various treatments of the bare substrate to eliminate CO formation and epitaxial oxide detachment has been demonstrated. TDS provides both a means to evaluate the kinetics of the oxidation reaction and a tool to assess the need and effectiveness of a substrate oxidation treatment.

Engineered oxide thin films as 100% lattice match buffer layers for YBCO coated conductors

2003 ◽  
Vol 47 (12) ◽  
pp. 2171-2175 ◽  
Author(s):  
Y. Akin ◽  
Z.K. Heiba ◽  
W. Sigmund ◽  
Y.S. Hascicek
Keyword(s):  
Thin Films ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Oxide Thin Films ◽  
Lattice Match ◽  
Ybco Coated Conductors

Deposition of rare earth tantalate buffers on textured Ni-W substrates for YBCO coated conductor using chemical solution deposition approach

2006 ◽  
Vol 21 (3) ◽  
pp. 767-773 ◽  
Author(s):  
M.S. Bhuiyan ◽  
M. Paranthaman ◽  
A. Goyal ◽  
L. Heatherly ◽  
D.B. Beach
Keyword(s):  
Rare Earth ◽  
Chemical Solution Deposition ◽  
Precursor Solution ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ybco Coated Conductors

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE3TaO7 with pyrochlore structures were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3∼0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050∼1100 °C in a gas mixture of Ar- 4% H2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La3TaO7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE3TaO7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa2Cu3O7-δ (YBCO) coated conductors.

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