Semiconductor device reliability in extreme high temperature space environments

2002 ◽  
Author(s):  
W.T. Anderson
Keyword(s):  
High Temperature ◽  
Semiconductor Device ◽  
Device Reliability ◽  
Extreme High Temperature ◽  
Semiconductor Device Reliability ◽  
Space Environments

Improved Semiconductor Device Reliability from Plasma Dicing

2019 ◽  
Author(s):  
R. Barnett ◽  
Janet Hopkins ◽  
Stewart Fulton ◽  
Oliver Ansell ◽  
Samira Kazemi ◽  
...  
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability

Silicon Wafer Orientation Dependence of Metal Oxide Semiconductor Device Reliability

1994 ◽  
Vol 33 (Part 1, No. 1B) ◽  
pp. 500-504 ◽  
Author(s):  
Kou Nakamura ◽  
Kazuyuki Ohmi ◽  
Kazuma Yamamoto ◽  
Koji Makihara ◽  
Tadahiro Ohmi
Keyword(s):  
Metal Oxide ◽  
Silicon Wafer ◽  
Semiconductor Device ◽  
Orientation Dependence ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Device Reliability ◽  
Semiconductor Device Reliability ◽  
Wafer Orientation

Elements of semiconductor-device reliability

1974 ◽  
Vol 62 (2) ◽  
pp. 149-168 ◽  
Author(s):  
C.G. Peattie ◽  
J.D. Adams ◽  
S.L. Carrell ◽  
T.D. George ◽  
M.H. Valek
Keyword(s):  
Semiconductor Device ◽  
Device Reliability ◽  
Semiconductor Device Reliability
Sign in / Sign up

Export Citation Format

Share Document