Abstract
Quantitative seismology is based firmly on the analysis of actual ground motions, and the transition to digital recording in the 1980s enabled sophisticated new capabilities to extract useful results from waveforms. With some effort, these tools can also be applied to analog records. Focusing on assets available within U.S. institutions, we review the necessary steps and the challenges in enabling “data rescue”—that is, preserving the scientific information latent in large analog seismogram archives and making it usable. They include: determining what assets are available (the analog seismogram archives held by various institutions, with associated metadata on instrument responses, station locations, and timing information); developing a consensus on the top level of a triage process (which analog records most definitely should be rescued?); deciding the level of quality needed in copying original seismograms to media suitable for digitizing; assessing the relative merits of scanning and digitizing; and, the need for a community service in distributing scans and digital records, as they accumulate. The necessary level of effort can benefit from practical experience. For example, specific studies have used digitized versions of analog recordings to model earthquake sources and assess seismic hazard. Other studies have used them to gain experience with nuclear explosion signals recorded at regional distances, noting that regional signals enable explosions to be monitored down to levels much lower than those attainable teleseismically.
The opportunities presented by large archives of analog seismograms include the insights they present to current and future seismologists studying earthquakes and explosions, into the practical areas of assessing seismic hazard, monitoring for test ban compliance down to low explosion yields—and prompt characterization of actual explosions should they occur, as well the traditional academic pursuit of a better understanding of earthquake physics.
Low-Process–Voltage–Temperature-Sensitivity Multi-Stage Timing Monitor for System-on-Chip Applications