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A diagnostic test pattern generation algorithm
Proceedings. International Test Conference 1990
◽
10.1109/test.1990.114000
◽
2002
◽
Cited By ~ 72
Author(s):
P. Camurati
◽
D. Medina
◽
P. Prinetto
◽
M. Sonza Reorda
Keyword(s):
Diagnostic Test
◽
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
Download Full-text
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Cited By
References
An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability
16th Asian Test Symposium (ATS 2007)
◽
10.1109/ats.2007.80
◽
2007
◽
Cited By ~ 21
Author(s):
Feijun Zheng
◽
Kwang-Ting Cheng
◽
Xiaolang Yan
◽
John Moondanos
◽
Ziyad Hanna
Keyword(s):
Diagnostic Test
◽
Test Pattern
◽
Boolean Satisfiability
◽
Pattern Generation
◽
Test Pattern Generation
Download Full-text
A test pattern generation algorithm exploiting behavioral information
Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259)
◽
10.1109/ats.1998.741660
◽
2002
◽
Cited By ~ 2
Author(s):
S. Chiusano
◽
F. Corno
◽
P. Prinetto
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
◽
Behavioral Information
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Multiple-fault diagnosis based on adaptive diagnostic test pattern generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/tcad.2007.8361586
◽
2007
◽
Vol 26
(5)
◽
pp. 932-942
Author(s):
Yung-Chieh Lin
◽
Feng Lu
◽
Kwang-Ting Cheng
Keyword(s):
Fault Diagnosis
◽
Diagnostic Test
◽
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Multiple Fault
◽
Multiple Fault Diagnosis
Download Full-text
A test-pattern-generation algorithm for sequential circuits
IEEE Design & Test of Computers
◽
10.1109/54.82040
◽
1991
◽
Vol 8
(2)
◽
pp. 72-85
◽
Cited By ~ 29
Author(s):
E. Auth
◽
M.H. Schulz
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
Download Full-text
GA based diagnostic test pattern generation for transition faults
2015 19th International Symposium on VLSI Design and Test
◽
10.1109/isvdat.2015.7208122
◽
2015
◽
Cited By ~ 2
Author(s):
Anupam Bhar
◽
Santanu Chattopadhyay
◽
Indranil Sengupta
◽
Rohit Kapur
Keyword(s):
Diagnostic Test
◽
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Transition Faults
Download Full-text
Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
◽
10.1109/test.2000.894246
◽
2002
◽
Cited By ~ 9
Author(s):
R. Butler
◽
B. Keller
◽
S. Paliwal
◽
R. Schoonover
◽
J. Swenton
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Test Vector
◽
Automatic Test
◽
Generation Algorithm
◽
Design And Implementation
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A new switch-level test pattern generation algorithm based on single path over a graph representation
Proceedings of the European Design Automation Conference, 1990., EDAC.
◽
10.1109/edac.1990.136681
◽
2002
◽
Author(s):
C. Ferrer
◽
J. Oliver
◽
E. Valderrama
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Graph Representation
◽
Test Pattern Generation
◽
Generation Algorithm
◽
Single Path
Download Full-text
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287)
◽
10.1109/iccad.1998.742865
◽
2002
◽
Cited By ~ 1
Author(s):
V. Boppana
◽
I.K. Fuchs
Keyword(s):
Diagnostic Test
◽
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
Download Full-text
Interconnect test pattern generation algorithm for meeting device and global SSO limits with safe initial vectors
2004 International Conferce on Test
◽
10.1109/test.2004.1386949
◽
2005
◽
Cited By ~ 2
Author(s):
K. Baker
◽
M. Nourani
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
◽
Interconnect Test
Download Full-text
New probabilistic measures for accelerating the automatic test pattern generation algorithm
AUTOTESTCON 93
◽
10.1109/autest.1993.396314
◽
2002
◽
Author(s):
B. Phillips
◽
S. Ganesan
◽
C. Bacon
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Automatic Test
◽
Generation Algorithm
◽
Probabilistic Measures
Download Full-text
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