Parameter extraction technique for accurate measurement of minority electron mobility in N-p-n AlGaAs/GaAs HBTs

[1991] Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits ◽

10.1109/cornel.1991.169997 ◽

2002 ◽

Author(s):

S. Lee ◽

A. Gopinath ◽

S.J. Pachuta

Keyword(s):

Electron Mobility ◽

Parameter Extraction ◽

Extraction Technique

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Improved small‐signal hybrid parameter‐extraction technique for AlGaN / GaN high electron mobility transistors

International Journal of RF and Microwave Computer-Aided Engineering ◽

10.1002/mmce.22562 ◽

2021 ◽

Author(s):

Xuekun Du ◽

Mohamed Helaoui ◽

Jialin Cai ◽

Jun Liu ◽

Fadhel M. Ghannouchi

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

Parameter Extraction ◽

Extraction Technique ◽

High Electron ◽

Small Signal ◽

High Electron Mobility ◽

Electron Mobility Transistors

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High frequency noise modeling of SiGe HBTs using a direct parameter extraction technique

The 10th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications ◽

10.1109/edmo.2002.1174953 ◽

2003 ◽

Author(s):

U. Basaran ◽

M. Berroth

Keyword(s):

High Frequency ◽

Parameter Extraction ◽

Extraction Technique ◽

Frequency Noise ◽

High Frequency Noise ◽

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Novel illumination and parameter extraction technique for the characterization of multilayer structures in the GHz range with deep sub-wavelength resolution

2015 IEEE 15th Mediterranean Microwave Symposium (MMS) ◽

10.1109/mms.2015.7375420 ◽

2015 ◽

Author(s):

Ali Pourkazemi ◽

Willy Ranson ◽

Johan Stiens ◽

Mathias Becquaert ◽

Marijke Vandewal

Keyword(s):

Parameter Extraction ◽

Extraction Technique ◽

Multilayer Structures ◽

Wavelength Resolution ◽

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Large Signal Statistical Model Oriented Parameter Extraction Method for GaN High Electron Mobility Transistors

Chinese Journal of Electronics ◽

10.1049/cje.2017.09.033 ◽

2017 ◽

Vol 26 (6) ◽

pp. 1319-1324

Author(s):

Xuming Yu ◽

Yuehang Xu ◽

Zhang Wen ◽

Zhikai Chen ◽

Wei Hong

Keyword(s):

Statistical Model ◽

Electron Mobility ◽

Extraction Method ◽

High Electron Mobility Transistors ◽

Parameter Extraction ◽

High Electron ◽

Large Signal ◽

High Electron Mobility ◽

Electron Mobility Transistors

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A Novel Port/Network Parameter Extraction Technique for Coupling Circuits With Full-Wave Time-Domain Integral Equation Solvers

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2018.2880961 ◽

2019 ◽

Vol 67 (2) ◽

pp. 553-564

Author(s):

Scott O'Connor ◽

Stephen Hughey ◽

Dan Dault ◽

Andrew J. Pray ◽

Jorge M. Villa-Giron ◽

...

Keyword(s):

Integral Equation ◽

Time Domain ◽

Parameter Extraction ◽

Extraction Technique ◽

Network Parameter ◽

Full Wave ◽

Domain Integral ◽

Time Domain Integral Equation

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C-V parameter extraction technique for characterisation the diffused junctions of semiconductor devices

2008 International Semiconductor Conference ◽

10.1109/smicnd.2008.4703419 ◽

2008 ◽

Author(s):

Miron J. Cristea ◽

Florin Babarada

Keyword(s):

Semiconductor Devices ◽

Parameter Extraction ◽

Extraction Technique

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Large-signal diode modeling-an alternative parameter-extraction technique

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2005.852747 ◽

2005 ◽

Vol 53 (8) ◽

pp. 2633-2638 ◽

Author(s):

Yew Hui Liew ◽

J. Joe

Keyword(s):

Parameter Extraction ◽

Extraction Technique ◽

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Automatic parameter extraction technique for gate leakage current modeling in double gate MOSFET

Solid-State Electronics ◽

10.1016/j.sse.2013.07.009 ◽

2013 ◽

Vol 89 ◽

pp. 111-115

Author(s):

Ghader Darbandy ◽

Thomas Gneiting ◽

Heidrun Alius ◽

Joaquín Alvarado ◽

Antonio Cerdeira ◽

...

Keyword(s):

Leakage Current ◽

Parameter Extraction ◽

Extraction Technique ◽

Double Gate ◽

Gate Leakage Current ◽

Gate Leakage ◽

Double Gate Mosfet

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Unilateral Amplifier S-Parameter Extraction Technique

IEEE/ACES International Conference on Wireless Communications and Applied Computational Electromagnetics, 2005. ◽

10.1109/wcacem.2005.1469703 ◽

2005 ◽

Author(s):

K.S. Ching ◽

R.Y. Miyamoto ◽

W.A. Shiroma

Keyword(s):

Parameter Extraction ◽

Extraction Technique ◽

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Parameter extraction technique for HBT equivalent circuit using cutoff mode measurement

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/22.121736 ◽

1992 ◽

Vol 40 (3) ◽

pp. 574-577 ◽

Author(s):

S. Lee ◽

A. Gopinath

Keyword(s):

Equivalent Circuit ◽

Parameter Extraction ◽

Extraction Technique

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