Transformer bridge for the high-accuracy comparisons of standard resistors at low frequencies

Author(s):  
A. Ploshinsky
2017 ◽  
Vol 24 (2) ◽  
pp. 425-436 ◽  
Author(s):  
Reyhaneh L. Namin ◽  
Shahin J. Ashtiani

AbstractIn this paper, the effect of the resolution of an analogue-to-digital converter (ADC) on the accuracy of timedomain low-frequency electrical impedance spectroscopy is examined. For the first time, we demonstrated that different wideband stimuli signals used for impedance spectroscopy have different sensitivities to the resolution of ADC used in impedance spectroscopy systems. We also proposed Ramp and Half-Gaussian signals as new wideband stimulating signals for EIS. The effect of ADC resolution was studied for Sinc, Gaussian, Half-Gaussian, and Ramp excitation signals using both simulation and experiments. We found that Ramp and Half-Gaussian signals have the best performance, especially at low frequencies. Based on the results, a wideband electrical impedance spectroscopy circuit was implemented with a high accuracy at frequencies bellow 10 Hz.


Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.


2019 ◽  
Vol 62 (5) ◽  
pp. 1486-1505
Author(s):  
Joshua M. Alexander

PurposeFrequency lowering in hearing aids can cause listeners to perceive [s] as [ʃ]. The S-SH Confusion Test, which consists of 66 minimal word pairs spoken by 6 female talkers, was designed to help clinicians and researchers document these negative side effects. This study's purpose was to use this new test to evaluate the hypothesis that these confusions will increase to the extent that low frequencies are altered.MethodTwenty-one listeners with normal hearing were each tested on 7 conditions. Three were control conditions that were low-pass filtered at 3.3, 5.0, and 9.1 kHz. Four conditions were processed with nonlinear frequency compression (NFC): 2 had a 3.3-kHz maximum audible output frequency (MAOF), with a start frequency (SF) of 1.6 or 2.2 kHz; 2 had a 5.0-kHz MAOF, with an SF of 1.6 or 4.0 kHz. Listeners' responses were analyzed using concepts from signal detection theory. Response times were also collected as a measure of cognitive processing.ResultsOverall, [s] for [ʃ] confusions were minimal. As predicted, [ʃ] for [s] confusions increased for NFC conditions with a lower versus higher MAOF and with a lower versus higher SF. Response times for trials with correct [s] responses were shortest for the 9.1-kHz control and increased for the 5.0- and 3.3-kHz controls. NFC response times were also significantly longer as MAOF and SF decreased. The NFC condition with the highest MAOF and SF had statistically shorter response times than its control condition, indicating that, under some circumstances, NFC may ease cognitive processing.ConclusionsLarge differences in the S-SH Confusion Test across frequency-lowering conditions show that it can be used to document a major negative side effect associated with frequency lowering. Smaller but significant differences in response times for correct [s] trials indicate that NFC can help or hinder cognitive processing, depending on its settings.


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