Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns

Test-architecture optimization and test scheduling for SOCs with core-level expansion of compressed test patterns

2008 Design, Automation and Test in Europe ◽

10.1145/1403375.1403422 ◽

2008 ◽

Author(s):

Anders Larsson ◽

Erik Larsson ◽

Krishnendu Chakrabarty ◽

Petru Eles ◽

Zebo Peng

Keyword(s):

Core Level ◽

Test Scheduling ◽

Test-Architecture Optimization and Test Scheduling

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs ◽

10.1007/978-3-319-02378-6_8 ◽

2013 ◽

pp. 181-237

Author(s):

Brandon Noia ◽

Krishnendu Chakrabarty

Keyword(s):

Test Scheduling ◽

Test-Architecture Optimization and Test Scheduling for TSV-Based 3-D Stacked ICs

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2160177 ◽

2011 ◽

Vol 30 (11) ◽

pp. 1705-1718 ◽

Cited By ~ 45

Author(s):

B. Noia ◽

K. Chakrabarty ◽

S. K. Goel ◽

E. J. Marinissen ◽

J. Verbree

Keyword(s):

Test Scheduling ◽

Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2160410 ◽

2012 ◽

Vol 20 (9) ◽

pp. 1621-1633 ◽

Cited By ~ 14

Author(s):

Li Jiang ◽

Qiang Xu ◽

K. Chakrabarty ◽

T. M. Mak

Keyword(s):

Test Scheduling ◽

Test Architecture Optimization for Post-bond Test and Pre-bond Tests of 3D SoCs Using TAM Reuse

IETE Journal of Research ◽

10.1080/03772063.2020.1870873 ◽

2021 ◽

pp. 1-11

Author(s):

Surajit Kumar Roy ◽

Chandan Giri

Keyword(s):

Bond Tests ◽

Reconfigured test architecture optimization for TSV-based three-dimensional SoCs

IEICE Electronics Express ◽

10.1587/elex.11.20140661 ◽

2014 ◽

Vol 11 (16) ◽

pp. 20140661-20140661 ◽

Cited By ~ 1

Author(s):

Kele Shen ◽

Dong Xiang ◽

Zhou Jiang

Keyword(s):

Three Dimensional ◽

SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects

2007 44th ACM/IEEE Design Automation Conference ◽

10.1109/dac.2007.375250 ◽

2007 ◽

Author(s):

Qiang Xu ◽

Yubin Zhang ◽

Krishnendu Chakrabarty

Keyword(s):

Signal Integrity ◽

Soc Test ◽

Core-Level Compression Technique Selection and SOC Test Architecture Design

2008 17th Asian Test Symposium ◽

10.1109/ats.2008.71 ◽

2008 ◽

Author(s):

Anders Larsson ◽

Xin Zhang ◽

Erik Larsson ◽

Krishnendu Chakrabarty

Keyword(s):

Core Level ◽

Architecture Design ◽

Compression Technique ◽

Soc Test ◽

SOC test-architecture optimization for the testing of embedded cores and signal-integrity faults on core-external interconnects

ACM Transactions on Design Automation of Electronic Systems ◽

10.1145/1455229.1455233 ◽

2009 ◽

Vol 14 (1) ◽

pp. 1-27 ◽

Cited By ~ 5

Author(s):

Qiang Xu ◽

Yubin Zhang ◽

Krishnendu Chakrabarty

Keyword(s):

Signal Integrity ◽

Soc Test ◽

Embedded Cores ◽

SOC test architecture optimization for signal integrity faults on core-external interconnects

2007 44th ACM/IEEE Design Automation Conference ◽

10.1145/1278480.1278651 ◽

2007 ◽

Author(s):

Qiang Xu ◽

Yubin Zhang ◽

Krishnendu Chakrabarty

Keyword(s):

Signal Integrity ◽

Soc Test ◽