Improving small-delay fault coverage for on-chip delay measurement

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378223 ◽

2012 ◽

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Delay Measurement ◽

Small Delay ◽

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Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion

IEICE Transactions on Information and Systems ◽

10.1587/transinf.2014edp7110 ◽

2014 ◽

Vol E97.D (10) ◽

pp. 2719-2729

Author(s):

Wenpo ZHANG ◽

Kazuteru NAMBA ◽

Hideo ITO

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Test Point Insertion ◽

Delay Measurement ◽

Small Delay ◽

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Area overhead reduction for small-delay defect detection using on-chip delay measurement

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2014.7021171 ◽

2014 ◽

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Defect Detection ◽

Area Overhead ◽

Delay Measurement ◽

Small Delay ◽

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A Novel Delay Fault Testing Methodology Using On-Chip Low-Overhead Delay Measurement Hardware at Strategic Probe Points

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.2 ◽

2005 ◽

Author(s):

A. Raychowdhury ◽

S. Ghosh ◽

S. Bhunia ◽

D. Ghosh ◽

K. Roy

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Testing Methodology ◽

Delay Measurement ◽

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An On-Chip Delay Measurement Technique Using Signature Registers for Small-Delay Defect Detection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2125994 ◽

2012 ◽

Vol 20 (5) ◽

pp. 804-817 ◽

Author(s):

K. Katoh ◽

K. Namba ◽

H. Ito

Keyword(s):

Defect Detection ◽

Measurement Technique ◽

Delay Measurement ◽

Small Delay ◽

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An On-chip Path Delay Measurement Sensor for Aging Monitoring

10.1109/asicon52560.2021.9620372 ◽

2021 ◽

Author(s):

Dongrong Zhang ◽

Qiang Ren ◽

Donglin Su

Keyword(s):

Measurement Sensor ◽

Delay Measurement ◽

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Flip–flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage

International Journal of Systems Assurance Engineering and Management ◽

10.1007/s13198-013-0170-9 ◽

2013 ◽

Vol 4 (3) ◽

pp. 303-311 ◽

Author(s):

Ashok Kumar Suhag ◽

Vivek Shrivastava ◽

Nidhi Singh

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Flip Flop ◽

High Transition ◽

Selection For ◽

Transition Delay ◽

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Nonenumerative path delay fault coverage estimation with optimal algorithms

Proceedings International Conference on Computer Design VLSI in Computers and Processors ICCD-97 ◽

10.1109/iccd.1997.628896 ◽

2002 ◽

Author(s):

D. Kagaris ◽

S. Tragoudas ◽

D. Karayiannis

Keyword(s):

Fault Coverage ◽

Optimal Algorithms ◽

Delay Fault ◽

Path Delay Fault ◽

Coverage Estimation ◽

Fault Coverage Estimation

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Improved delay fault coverage in SoC using controllable multi-Scan-Enable

2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology ◽

10.1109/icsict.2010.5667837 ◽

2010 ◽

Author(s):

Jin-yi Zhang ◽

Xu-hui Huang ◽

Wan-lin Cai ◽

Han-yi Weng

Keyword(s):

Fault Coverage ◽

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Delay fault coverage and performance tradeoffs

Proceedings of the 30th international on Design automation conference - DAC '93 ◽

10.1145/157485.164970 ◽

1993 ◽

Author(s):

William K. Lam ◽

Alexander Saldanha ◽

Robert K. Brayton ◽

Alberto L. Sangiovanni-Vincentelli

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

And Performance

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GPU-Accelerated Small Delay Fault Simulation

Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 ◽

10.7873/date.2015.0077 ◽

2015 ◽

Author(s):

Eric Schneider ◽

Stefan Holst ◽

Michael A. Kochte ◽

Xiaoqing Wen ◽

Hans-Joachim Wunderlich

Keyword(s):

Fault Simulation ◽

Delay Fault ◽

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