An On-chip Path Delay Measurement Sensor for Aging Monitoring

Mapping Intimacies ◽

10.1109/asicon52560.2021.9620372 ◽

2021 ◽

Author(s):

Dongrong Zhang ◽

Qiang Ren ◽

Donglin Su

Keyword(s):

Measurement Sensor ◽

Delay Measurement ◽

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A High-Precision Wide Range On-Chip Path Delay Measurement

International Journal of Engineering Trends and Technology ◽

10.14445/22315381/ijett-v11p290 ◽

2014 ◽

Vol 11 (9) ◽

pp. 450-454

Author(s):

Neelufar Naheed Saudagar ◽

◽

Seema Deshmukh

Keyword(s):

High Precision ◽

Delay Measurement ◽

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Path-RO: A novel on-chip critical path delay measurement under process variations

2008 IEEE/ACM International Conference on Computer-Aided Design ◽

10.1109/iccad.2008.4681644 ◽

2008 ◽

Author(s):

Xiaoxiao Wang ◽

Mohammad Tehranipoor ◽

Ramyanshu Datta

Keyword(s):

Critical Path ◽

Process Variations ◽

Critical Path Delay ◽

Delay Measurement ◽

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A novel architecture for on-chip path delay measurement

2009 International Test Conference ◽

10.1109/test.2009.5355742 ◽

2009 ◽

Author(s):

Xiaoxiao Wang ◽

Mohammad Tehranipoor ◽

Ramyanshu Datta

Keyword(s):

Delay Measurement ◽

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A Low Overhead On-Chip Path Delay Measurement Circuit

2009 Asian Test Symposium ◽

10.1109/ats.2009.64 ◽

2009 ◽

Author(s):

Songwei Pei ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Measurement Circuit ◽

Delay Measurement ◽

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A High-Precision On-Chip Path Delay Measurement Architecture

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2011.2161353 ◽

2012 ◽

Vol 20 (9) ◽

pp. 1565-1577 ◽

Author(s):

Songwei Pei ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

High Precision ◽

Delay Measurement ◽

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Path Delay Measurement with Correction for Temperature And Voltage Variations

2020 IEEE International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia51099.2020.00031 ◽

2020 ◽

Author(s):

Yousuke Miyake ◽

Takaaki Kato ◽

Seiji Kajihara

Keyword(s):

Delay Measurement

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Area overhead reduction for small-delay defect detection using on-chip delay measurement

2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2014.7021171 ◽

2014 ◽

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Defect Detection ◽

Area Overhead ◽

Delay Measurement ◽

Small Delay ◽

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Improving small-delay fault coverage for on-chip delay measurement

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2012.6378223 ◽

2012 ◽

Author(s):

Wenpo Zhang ◽

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Delay Measurement ◽

Small Delay ◽

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A low power, high dynamic range and area efficient cyclic on-chip delay measurement architecture

2014 26th International Conference on Microelectronics (ICM) ◽

10.1109/icm.2014.7071807 ◽

2014 ◽

Author(s):

R. Krishnamurthy ◽

M.S. Hashmi

Keyword(s):

Low Power ◽

Dynamic Range ◽

High Dynamic Range ◽

Delay Measurement ◽

High Dynamic ◽

On Chip ◽

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On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test

2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts50870.2020.9159717 ◽

2020 ◽

Author(s):

Yousuke Miyake ◽

Takaaki Kato ◽

Seiji Kajihara ◽

Masao Aso ◽

Haruji Futami ◽

...

Keyword(s):

Accelerated Life Test ◽

Life Test ◽

Accelerated Life ◽

Delay Measurement ◽

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