Role of Electrical and Thermal Contact Resistance in the High-Bias Joule Breakdown of Single-Wall Carbon Nanotube Devices
2011 ◽
Vol 34
(12)
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pp. 2351-2360
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Keyword(s):
1975 ◽
Vol 12
(12)
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pp. 782-784
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2008 ◽
Vol 112
(3)
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pp. 654-658
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