Evaluation of thermal shear strains in flip-chip package by electronic speckle pattern interferometry (ESPI)

Author(s):  
Woosoon Jang ◽  
Baik-Woo Lee ◽  
Dong-Won Kim ◽  
Jae-Woong Nah ◽  
Kyung-Wook Paik ◽  
...  
2014 ◽  
Vol 2014 (DPC) ◽  
pp. 000479-000500
Author(s):  
Ibon Ocana

Flip-chip packages are produced by an interconnection technique in which the active area of a chip is mounted by various interconnecting materials on a multilayer substrate. While flip-chip technologies have progressed rapidly and are now widely used, they present special reliability concerns. A large thermal expansion mismatch between the chip and the substrate increases the likelihood of fatigue failure in solder joints under cyclic thermal loading. In addition, the thermal mismatch often results in the delamination of interfaces between two materials, which eventually leads to mechanical and/or electrical failure. In this paper the use of piezo actuators to mimic stresses during packaging assembly and in operation is discussed. The test has been modeled using finite elements and the results show that the level of stresses reached during packaging can be attained. Electronic speckle-pattern interferometry (ESPI) was applied for noncontact, real-time evaluation of the deformation. Failure analysis has been performed using an FIB dual beam. Cracks extending from the bump edge through the structures under study have been observed.


2006 ◽  
Vol 326-328 ◽  
pp. 505-508 ◽  
Author(s):  
Wei Chung Wang ◽  
Shing Chen ◽  
Chun Hsien Liu ◽  
Chun Yao Ni

In the manufacturing process of flip-chips, ultrasonic bonding has been widely used. In the past, however, the ultrasonic horn was designed to move horizontally while the bonding force was applied vertically, the motion control of the horn thus cannot be controlled accurately. In addition, non-coplanar effects were unavoidably occurred and the quality of bonding became unacceptable. In this paper, the non-coplanar phenomenon between the horn and the substrate was attempted to improve by designing the horn with the following features: 1. The resonant mode of the horn is purely longitudinal; 2. The contact surface between the horn and the flip-chip in the substrate remain plane; The finite element method (FEM) was used to design the ultrasonic horn with the above features. In the future, the amplitude-fluctuation electronic speckle pattern interferometry (AF-ESPI) will be used to verify the FEM results.


2004 ◽  
Vol 380 (1-2) ◽  
pp. 231-236 ◽  
Author(s):  
Baik-Woo Lee ◽  
Woosoon Jang ◽  
Dong-Won Kim ◽  
Jeung-hyun Jeong ◽  
Jae-Woong Nah ◽  
...  

2000 ◽  
Vol 14 (5) ◽  
pp. 477-482 ◽  
Author(s):  
Koung Suk Kim ◽  
Wan Shik Jang ◽  
Myung Seak Hong ◽  
Ki Soo Kang ◽  
Hyun Chul Jung ◽  
...  

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